Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2015] | [2016] | [2017] | [2018] | [2019] | [2020] | [2021] | [Japanese] / [English]
SCE2018-7
Non-Destructive Testing of Metal Plate Using HTS Coil Driven by an Inverter
Teruyoshi Sasayama, Keiji Enpuku (Kyushu Univ.)
pp. 1 - 6
SCE2018-8
All-Round Inspection of a Pipe Using High-Temperature Superconductor SQUID and Magnetostriction-Based Ultrasonic Guided Wave
Azuma Yuki, Yoshimi Hatsukade (Kindai Univ.), Seiji Adachi, Keiichi Tanabe (SUSTERA)
pp. 7 - 12
SCE2018-9
Design of sub-Flux Quantum Feedback Digital SQUID Magnetometer with First-order Sinc Filter
Ryo Matsunawa, Kosuke Okabe, Masato Naruse, Tohru Taino, Hiroaki Myoren (Saitama Univ.)
pp. 13 - 17
SCE2018-10
Kinetic inductance in superconducting TiN coplanar waveguide resonator
Wei Qiu, Hirotaka Terai (NICT)
pp. 19 - 22
SCE2018-11
(See Japanese page.)
pp. 23 - 27
SCE2018-12
Proposal of 0-π SQUID based matrix memory driven by SFQ pulses
Yuto Takeshita, Tomohiro Kamiya, Masamitsu Tanaka (Nagoya Univ.), Taro Yamashita (Nagoya Univ., JST PRESTO), Akira Fujimaki (Nagoya Univ.)
pp. 29 - 34
SCE2018-13
Radiation detection experiment by Nb superconducting resonator
Tomohiko Ando, Masato Naruse, Toru Taino, Hiroaki Myoren (Saitama Univ)
pp. 35 - 40
SCE2018-14
Proposal of a single-flux-quantum based event-driven encoder using a row-column readout architecture for a large pixel superconducting nanowire single photon detector array
Shigeyuki Miyajima, Masahiro Yabuno (NICT), Shigehito Miki (NICT/Kobe Univ.), Hirotaka Terai (NICT)
pp. 41 - 46
SCE2018-15
Proposal and Demonstration of Inverting Quantum Flux Parametron Circuits
Kota Arai (Yokohama Natl. Univ.), Naoki Takeuchi (JST-PRESTO), Yuki Yamanashi, Nobuyuki Yoshikawa (Yokohama Natl. Univ.)
pp. 47 - 51
SCE2018-16
Design of Adiabatic Quantum-Flux-Parametron Integrated Circuits Using an Automated Placement Tool Based on Genetic Algorithms
Tomoyuki Tanaka, Christopher Ayala, XU Qiuyun, Ro Saito, Nobuyuki Yoshikawa (Yokohama National Univ.)
pp. 53 - 57
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.