IEICE Technical Report

Online edition: ISSN 2432-6380

Volume 120, Number 267

Reliability

Workshop Date : 2020-11-30 / Issue Date : 2020-11-23

[PREV] [NEXT]

[TOP] | [2017] | [2018] | [2019] | [2020] | [2021] | [2022] | [2023] | [Japanese] / [English]

[PROGRAM] [BULK PDF DOWNLOAD]


Table of contents

R2020-23
Ant Colony Optimization Algorithm Based on Birnbaum Importance and Necessary Condition for Optimal Arrangement Problems in a Linear Consecutive-k-out-of-n: F System
Issin Honma, Hisashi Yamamoto (Tokyo Metropolitan Univ.), Taishin Nakamura (Tokai Univ.)
pp. 1 - 6

R2020-24
On Software Safety Integrity Assessment for E/E/PE Safety-Related Systems
Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab. Inc.), Shigeru Yamada (Tottori Univ.)
pp. 7 - 12

R2020-25
(See Japanese page.)
pp. 13 - 16

R2020-26
Verification of effect by comparison of temperature cycle test and thermal shock test
Yuri Saito, Matsuguma Osamu, Aoki Yuichi (ESPEC)
pp. 17 - 20

R2020-27
Analysis for Degraded MLCC Using Voltage Contrast Method in SEM
Akira Saito (Murata)
pp. 21 - 24

R2020-28
Stochastic Modeling and Filtering for Reliability Predictions of Degradation Processes
Toru Kaise (Univ. of Hyogo)
pp. 25 - 29

R2020-29
A Study for Accelerated Humidity Stress Test (part 3)
Sadanori Itou (Itoken)
pp. 30 - 35

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan