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Paper Abstract and Keywords
Presentation 2020-11-30 15:45
A Study for Accelerated Humidity Stress Test (part 3)
Sadanori Itou (Itoken) R2020-29
Abstract (in Japanese) (See Japanese page) 
(in English) The humidity stress against electronics used in Japan cause the big influence for reliability. So, the humidity stress acceleration test is significant. However, the mechanism of humidity stress is so various that the evaluation method may not be suitable to cover all cases. Especially, high temperature and high humidity test tend to be regarded as the acceleration test, this assumption leads to the wrong example. Here, the humidity acceleration 85℃85% test is considered involved the advantages and disadvantages.
Keyword (in Japanese) (See Japanese page) 
(in English) Accelerated Humidity Stress Test / 85℃85% / Erectro-chemical Migration / CAF / / / /  
Reference Info. IEICE Tech. Rep., vol. 120, no. 267, R2020-29, pp. 30-35, Nov. 2020.
Paper # R2020-29 
Date of Issue 2020-11-23 (R) 
ISSN Online edition: ISSN 2432-6380
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2020-29

Conference Information
Committee R  
Conference Date 2020-11-30 - 2020-11-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Online 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability of semiconductor and electronic devices, Reliability general 
Paper Information
Registration To R 
Conference Code 2020-11-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Study for Accelerated Humidity Stress Test (part 3) 
Sub Title (in English)  
Keyword(1) Accelerated Humidity Stress Test  
Keyword(2) 85℃85%  
Keyword(3) Erectro-chemical Migration  
Keyword(4) CAF  
1st Author's Name Sadanori Itou  
1st Author's Affiliation Itoken office (Itoken)
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Date Time 2020-11-30 15:45:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2020-29 
Volume (vol) vol.120 
Number (no) no.267 
Page pp.30-35 
Date of Issue 2020-11-23 (R) 

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