IEICE Technical Report

Online edition: ISSN 2432-6380

Dependable Computing

Workshop Date : 2024-02-28 / Issue Date : 2024-02-21

DC2023-94
A Low Power Multi Bit Passive ΔΣ Modulator for Wearable Devices
Naoya Maruyama, Satoshi Komatsu (Tokyo Denki Univ.)
pp. 1 - 6

DC2023-95
System design using DICE-based edge-triggered soft-error-tolerant D-FF
Kazuteru Namba (Chiba Univ.)
pp. 7 - 10

DC2023-96
(See Japanese page.)
pp. 11 - 16

DC2023-97
A Study on Test Generation for Alleviating Over-testing of Approximate Multipliers
Qilin Wang, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.)
pp. 17 - 22

DC2023-98
Test Point Selection Method for Multi-Cycle BIST Using Deep Reinforcement Learning
Kohei Shiotani, Tatsuya Nishikawa, Shaoqi Wei, Senling Wang, Hiroshi Kai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.)
pp. 23 - 28

DC2023-99
A Low Power Oriented Multiple Target Test Generation Method for 2 Cycle Gate-Exhaustive Faults Using Pseudo Boolean Optimization
Momona Mizota, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyou Uni), Masayuki Arai (Nihon Univ)
pp. 29 - 34

DC2023-100
(See Japanese page.)
pp. 35 - 40

DC2023-101
Locating High Power Consuming Area by Branch and Reconvergence Topology Analysis for Logic Circuit
Tomoya Yamashita, Kohei Miyase, Xiaoqing Wen (Kyutech)
pp. 41 - 46

DC2023-102
On Additional Status Signal Sequences Generation to Improve Estimated Field Random Testability for Datapaths at Register Transfer Level
Yudai Toyooka, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.)
pp. 47 - 52

DC2023-103
(See Japanese page.)
pp. 53 - 58

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan