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Paper Abstract and Keywords
Presentation 2024-02-28 10:55
System design using DICE-based edge-triggered soft-error-tolerant D-FF
Kazuteru Namba (Chiba Univ.) DC2023-95
Abstract (in Japanese) (See Japanese page) 
(in English) The recent miniaturization of VLSI has made the effects of
radiation-induced soft errors more serious.
From this, many soft-error tolerant flip-flops have been presented.
The authors presented an edge-triggered soft-error tolerant flip-flop
using an asynchronous RS latch based on a DICE (Dual Interlocked Storage Cell)
as one of them in past work.
This paper has given experimental results to verify its usefulness.
The experimentation built a library using 45 nm technology and then
synthesized ISCAS 89 benchmark circuit with the Design compiler.
Then, the results gave evidence about the usefulness of the edge-triggered FF.
For example, it reduced the area by 4.2% for s838.1 and the clock period of 0.43 ns.
Keyword (in Japanese) (See Japanese page) 
(in English) soft error / DICE (Dual Interlocked Storage Cell) / edge triggered D-flip flop / / / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 389, DC2023-95, pp. 7-10, Feb. 2024.
Paper # DC2023-95 
Date of Issue 2024-02-21 (DC) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2023-95

Conference Information
Committee DC  
Conference Date 2024-02-28 - 2024-02-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2024-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) System design using DICE-based edge-triggered soft-error-tolerant D-FF 
Sub Title (in English)  
Keyword(1) soft error  
Keyword(2) DICE (Dual Interlocked Storage Cell)  
Keyword(3) edge triggered D-flip flop  
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1st Author's Name Kazuteru Namba  
1st Author's Affiliation Chiba University (Chiba Univ.)
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Speaker Author-1 
Date Time 2024-02-28 10:55:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2023-95 
Volume (vol) vol.123 
Number (no) no.389 
Page pp.7-10 
#Pages 4 
Date of Issue 2024-02-21 (DC) 

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