IEICE Technical Report

Online edition: ISSN 2432-6380

Volume 123, Number 445

Electromagnetic Compatibility

Workshop Date : 2024-03-15 / Issue Date : 2024-03-08

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Table of contents

EMCJ2023-104
A Study on Evaluation of Electromagnetic Leakage from Beam Wireless Power Transmission Systems Installed Building -- Vol.1 Evaluation Methods for Building Components --
Sonshu Sakihara, Tetsuo Endo, Koji Yamaguchi (Taisei), Ryosuke Suga, Yuki Masuko, Osamu Hashimoto (AGU)
pp. 1 - 6

EMCJ2023-105
A Study on Evaluation of Electromagnetic Leakage from Beam Wireless Power Transmission Systems Installed Building -- Vol.2 Database of Radio Wave Characteristics --
Koji Yamaguchi, Sonshu Sakihara, Tetsuo Endo (Taisei), Ryosuke Suga, Yuki Masuko, Osamu Hashimoto (AGU)
pp. 7 - 12

EMCJ2023-106
A Study on Evaluation of Electromagnetic Leakage from Beam Wireless Power Transmission Systems Installed Building -- Vol.3 Simulation Study --
Tetsuo Endo, Sonshu Sakihara, Koji Yamaguchi (Taisei), Ryosuke Suga, Yuki Masuko, Osamu Hashimoto (AGU)
pp. 13 - 17

EMCJ2023-107
An analysis of the reconstruction errors of absorbed power density assessment using inverse source method
Baharin Rasyidah Hanan Binti Mohd, Tomoaki Nagaoka (NICT)
pp. 18 - 22

EMCJ2023-108
Improvement of power durability in transparent electromagnetic shields with multi-layered conductive sheets
Hidetoshi Makimura, Yuta Sugiyama, Kengo Nishimoto, Yoshio Inasawa (Mitsubishi Electric Corp.)
pp. 23 - 28

EMCJ2023-109
Study on Frequency Response of Shielding Effectiveness for Near Magnetic-Field by Thin Conductive Shield
Taiki Yamagiwa, Yoshiki Kayano (UEC), Hiroshi Inoue (AU)
pp. 29 - 34

EMCJ2023-110
A method to analyze branching wire-harness as a multiconductor transmission line
Noboru Maeda (SOKEN), Keishi Miwa (TMC)
pp. 35 - 40

EMCJ2023-111
Investigation of Interference Voltage to Automotive Ethernet Transceiver IC in Powered ESD Test using Circuit Simulation
Toya Nakatani, Yusuke Yano, Jianqing Wang (NIT)
pp. 41 - 46

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan