IEICE Technical Report

Online edition: ISSN 2432-6380

Volume 124, Number 146

Integrated Circuits and Devices

Workshop Date : 2024-08-05 - 2024-08-07 / Issue Date : 2024-07-29

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Table of contents

ICD2024-16
[Invited Talk] Integrated Circuit Design for Enabling IoTs that has Co-Evolution Capability with Semiconductor Technology Scaling -- A 22nm 2-bit Supply-to-Digital Converter Using Always-Activated Supply-Controlled Oscillator and Supply-Dependent-Activation Buffers Enabling 0.9-2.6pW 0.1-0.25V for Bio-Fuel-Cell-Powered-and-Sensed Time-Stamped Bio-Recording --
Kiichi Niitsu (Kyoto Univ.)
pp. 1 - 6

ICD2024-17
[Invited Talk] A low-power low-noise magnetoimpedance-based Δ∑ magnetometer with background gain calibration and short-time CDS techniques
Ippei Akita (AIST), Shunichi Tatematsu (Aichi Steel)
pp. 7 - 8

ICD2024-18
Application of high-frequency Q-value enhancement technique for the glucose sensor that achieves high sensitivity and high resolution
Yasuhiro Sugimoto, Kiichi Yamashita, Akira Yasuda (Hosei U.)
pp. 9 - 14

ICD2024-19
Performance Enhancement and Design Optimization of Analog-to-Digital Converters Utilizing Dynamic Logics
Yuhao Xu, Ritaro Takenaka, Shuowei Li, Haoming Zhang, Tetsuya Iizuka (UTokyo)
pp. 15 - 20

ICD2024-20
[Memorial Lecture] Simulation Method for the Mean Free Path of Semiconductor Nanosheets with Surface Roughness
Jo Okada, Hajime Tanaka, Nobuya Mori (Osaka Univ.)
pp. 21 - 24

ICD2024-21
[Memorial Lecture] Output Power Properties of Flexible Thermoelectric Power Generators Based on Conductive Fabrics
Hudzaifah Al Hijri, Hiroya Ikeda, Hiromu Hamasaki (Shizuoka Univ.)
pp. 25 - 28

ICD2024-22
[Invited Talk] First Demonstration of Channel-All-Around TiO2 Channel FeFET
Shoichi Kabuyanagi, Takamasa Hamai, Masayuki Murase, Takeru Maeda, Masumi Saitoh, Shosuke Fujii (KIC)
p. 29

ICD2024-23
[Invited Talk] Resistivity reduction of word lines in 3D-NAND memory
Hiroshi Terada (TEL), Katsumasa Yamaguchi, Tsubasa Yokoi, Takashi Sameshima, Keisuke Suzuki (TTS), Genji Nakamura, Hiroyuki Nagai (TEL)
p. 30

ICD2024-24
[Invited Talk] Physics of Cryo-CMOS Devices -- Transient Characteristics --
Ken Uchida (UTokyo)
pp. 31 - 33

ICD2024-25
Understanding of Abnormal Vth Increase Induced by Hot Carrier Injection at Cryogenic Temperatures
Shunsuke Shitakata (Keio Univ./AIST), Hiroshi Oka, Kimihiko Kato, Takumi Inaba, Shota Iizuka, Hidehiro Asai, Takahiro Mori (AIST)
pp. 34 - 37

ICD2024-26
Reducing short-circuit current of CMOS Inverter circuits with “PN-Body Tied SOI-FET”
Kazuki Nakahashi, Takayuki Mori, Jiro Ida (Kanazawa Institute of Technology)
pp. 38 - 41

ICD2024-27
[Invited Talk] Terahertz Sensing with CMOS-IC -- Feasibility Verification for Short-Range Imaging using 300GHz MIMO Radar --
Ichiro Somada, Akihito Hirai, Akinori Taira, Kazuaki Ishioka, Takuma Nishimura, Koji Yamanaka (Mitsubishi Electric)
pp. 42 - 47

ICD2024-28
Automatic Circuit Topology Selection for Sub-THz Small-Signal Amplifiers using Machine Learning Models
Tsukasa Hasegawa, Kyoya Takano (Tokyo Univ. of Science)
pp. 48 - 52

ICD2024-29
A 100MHz Fully Package Integrated CMOS Class-D LC Oscillator Converter Using RC Filter-based Input Dead Time Controller
Atsuya Kakuta, Kousuke Miyaji (Shinshu university)
pp. 53 - 58

ICD2024-30
Evaluation of Electromagnetic Noise Emitted from Electronic Circuits in Industrial Drones and its Interference on GPS
Hiraku Uehara (Kobe Univ.), Koh Watanabe (NICT), Sosuke Ashida, Yushi Mitsuya, Satoshi Tanaka, Makoto Nagata (Kobe Univ.)
pp. 59 - 63

ICD2024-31
Evaluation and Analysis of Thermal Characteristics in Proximity within 3D Stacked Chips
Shuhei Yokota, Rikuu Hasegawa, Kazuki Monta, Takaaki Okidono, Takuji Miki, Makoto Nagata (Kobe Univ.)
pp. 64 - 68

ICD2024-32
[Invited Lecture] High resolution and compact integrated FMCW-LiDAR chip with 128 channels of Slow Light Grating Antennas
Yuya Maeda, Yoshiki Ebiko, Haruhiko Terada, Ryo Tetsuya, Yotaro Yasu, Shunji Maeda (Sony Semiconductor Solutions), Takemasa Tamanuki, Mikiya Kamata, Keisuke Hirotani, Saneyuki Suyama, Kohei Yamamoto, Shota Nawa, Riku Kubota, Toshihiko Baba (YNU)
pp. 69 - 72

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan