IEICE Technical Report

Online edition: ISSN 2432-6380

Volume 124, Number 230

Integrated Circuits and Devices

Workshop Date : 2024-11-01 / Issue Date : 2024-10-25

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Table of contents

ICD2024-33
Calculation of Target Transfer Function of Side Channel Leakage Path Based on Power Supply Noise Simulation
Rei Mitsuyasu, Masaki Himuro, Kengo Iokibe, Yoshitaka Toyota (Okayama Univ.)
pp. 1 - 6

ICD2024-34
Fundamental Study on Frequency Injection Attack on True Random Number Generator Using Phase-Locked Loop
Hikaru Nishiyama (AIST), Daisuke Fujimoto, Yuichi Hayashi (NAIST), Shinichi Kawamura (AIST)
pp. 7 - 11

ICD2024-35
Examination of current status and issues for establishing minimum security requirements of semiconductor chips in embedded devices.
Shinji Sato, Kota Ideguchi, Shinichi Kawamura (AIST), Makoto Nagata (Kobe Univ./AIST), Junichi Sakamoto, Hirotaka Yoshida (AIST)
pp. 12 - 17

ICD2024-36
(See Japanese page.)
pp. 18 - 21

ICD2024-37
Extension to Complex Movements of Human Detection System Using Broadcast Waves to Detect
Risa Yashiro, Shinya Marubashi (SECOM), Taiki Kitazawa, Yuichi Hayashi (NAIST), Hiroki Kunii (SECOM)
pp. 22 - 27

ICD2024-38
A study on authenticity determination using the electromagnetic characteristics of electronic devices
Tsuyoshi Kobayashi, Yoshiki Kato, Takahiro Horiguchi, Mio Akahori (Mitsubishi Electric)
pp. 28 - 31

ICD2024-39
A Study on the Effectiveness of 1bit-fault Model in Statistical Fault Analysis
Shungo Hayashi (AIST/YNU), Junichi Sakamoto, Hikaru Nishiyama, Tsutomu Matsumoto (AIST)
pp. 32 - 37

ICD2024-40
Fault Injection Attacks Exploiting High Voltage Pulsing over Si-Substrate Backside of IC chips
Yusuke Hayashi, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta, Takuji Miki, Makoto Nagata (Kobe Univ.)
pp. 38 - 43

ICD2024-41
Evaluation of Chip Internal Voltage Fluctuation and Digital Circuit Faults Induced by Electromagnetic Fault Injection Attacks
Rikuu Hasegawa, Kazuki Monta, Takuya Wadatsumi, Takuji Miki, Makoto Nagata (Kobe Univ.)
pp. 44 - 47

ICD2024-42
Integrated Multimodal Physical Attack Sensors for Lightweight Partial Re-Keying in Shared Group Key System
Ryuki Ikemoto, Soichiro Fujii, Kotaro Naruse, Jun Shiomi, Yoshihiro Midoh (Osaka Univ.), Yuki Yamashita, Misato Taguchi, Takuji Miki, Makoto Nagata (Kobe Univ.), Yuichi Komano (CIT), Mitsugu Iwamoto, Kazuo Sakiyama (UEC), Noriyuki Miura (Osaka Univ.)
pp. 48 - 52

ICD2024-43
Fixed Modulus Modular Reduction with Manipulated Lookup Table Method
Anawin Opasatian, Makoto Ikeda (Tokyo Univ.)
pp. 53 - 58

ICD2024-44
Secret Sharing Supporting Multi-input gates on FPGA Design for Less Communication Bandwidth Network
Yinfan Zhao, Makoto Ikeda (UTokyo)
pp. 59 - 64

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan