Online edition: ISSN 2432-6380
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HWS2025-61
Hardware Implementation of the Permutation Areion
Shotaro Oguma, Hiroshi Oguma (NIT, Toyama), Ryo Kishida (Toyama Pref. Univ.), Naofumi Homma (Tohoku Univ.)
pp. 1 - 6
HWS2025-62
A Study on Robust Deep Learning Side-Channel Analysis Based on Curriculum Learning
Tomone Kajikawa (Tohoku Univ.), Akira Ito (NTT), Rei Ueno (Kyoto Univ./Tohoku Univ.), Naofumi Homma (Tohoku Univ.)
pp. 7 - 12
HWS2025-63
Development of Confidential Asset Self-Destruction Leveraging Propellant Technology
Mikihiro Kasahara (CIT/JAXA), Katsuya Hasegawa (JAXA), Yuichi Komano, Yutaka Wada (CIT)
pp. 13 - 15
HWS2025-64
N/A
Ryusei Eda, Hibiki Nakanishi, Nozomu Togawa (Waseda Univ.)
pp. 16 - 21
HWS2025-65
N/A
Hibiki Nakanishi (Waseda Univ.), Kento Hasegawa, Seira Hidano, Kazuhide Fukushima (KDDI Research, Inc.), Kazuo Hashimoto, Nozomu Togawa (Waseda Univ.)
pp. 22 - 26
HWS2025-66
Design and Implementation of a Secure Communication Platform for CAN FD
Yu Watada, Takuya Kusaka (Shimane Univ.)
pp. 27 - 32
HWS2025-67
(See Japanese page.)
pp. 33 - 37
HWS2025-68
Fundamental Study on Fault Sensitivity Analysis Using Side-Channel Information and Plaintext Sets by Output Byte Value
Yuki Kanaya (NAIST), Hikaru Nishiyama (AIST), Daisuke Fujimoto, Yuichi Hayashi (NAIST)
pp. 38 - 42
HWS2025-69
A Non-Cryptographic Measurement Security Based on Inherent Uniqueness of Sensor Circuits
Ruochen Wang, Noriyuki Miura (Osaka Univ)
pp. 43 - 44
HWS2025-70
Evaluation of digital circuit characteristic variations caused by intentional backside voltage application in flip-chip devices
Shuhei Yokota, Rikuu Hasegawa, Takuya Wadatsumi, Kazuki Monta (Kobe Univ.), Junichi Sakamoto, Shinichi Kawamura (AIST), Makoto Nagata (Kobe Univ.)
pp. 45 - 47
HWS2025-71
Low-Voltage Design of a Charge Amplifier for Muon Imaging
Kakeru Fuchino, Takeshi Ohkawa, Masahiro Aoyagi (Kumamoto Univ.), Takeshi Kuboki (Hiroshima Univ.)
pp. 48 - 53
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.