IEICE Technical Report

Integrated Circuits and Devices

Workshop Date : 2026-08-04 - 2026-08-06 / Issue Date :

ICD2026-12
[Invited Talk] Further Scaling of the Capacitance Equivalent Thickness (CET) In High-k/Metal Gate Stacks Toward the 2nm Technology Node and Beyond: Prospects and Challenges
Yukinori Morita, Takamasa Kawanago, Takefumi Kamioka (AIST/LSTC), Yuichiro Mitani (Tokyo City Univ./LSTC), Toshihide Nabatame, Takashi Onaya, Naoki Fukata, Wipakorn Jevasuwan, Kazuhito Tsukagoshi (NIMS/LSTC), Takuya Hoshii (Science Tokyo/LSTC), Kasidit Toprasertpong, Atsushi Tamura, Koji Kita (The Univ. Tokyo/LSTC), Naoya Okada, Kenzo Manabe, Wataru Mizubayashi, Hiroyuki Ota, Takashi Matsukawa, Shinji Migita (AIST/LSTC)
pp. 1 - 6

ICD2026-13
Gate-length dependence of subthreshold slope in cryogenic operation of MOSFETs
Takumi Katori (AIST/TDU), Hidehiro Asai, Hiroshi Oka, Kimihiko Kato, Takumi Inaba, Yuika Kobayashi, Takashi Nakayama (AIST), Satoshi Moriyama (TDU), Takahiro Mori (AIST)
pp. 7 - 10

ICD2026-14
Single-Input Six-Output Isolated DC-DC Converter ICs for Gate Drivers in Three-Phase Inverters
Yichen Zhang, Yaogan Liang, Michihiro Ide, Makoto Takamiya (UTokyo)
pp. 11 - 16

ICD2026-15
Design of a Secure dToF LiDAR Architecture for Sensor-Level Attack Resilience
Risa Nonaka, Ryoya Matsuno, Shota Nagai, Satomi Miyagi, Masayuki Murakami, Kentaro Yoshioka (Keio Univ.)
pp. 17 - 21

ICD2026-16
[Memorial Lecture] Atomic layer deposited polycrystalline Ga-doped In2O3 nanosheet for integrated device applications
Takanori Takahashi (NAIST), Takuya Hoshii (Science Tokyo), Yuki Tsuruma, Misa Sunagawa, Shigekazu Tomai (Idemitsu Kosan), Jongho Park, Hiroki Tamamoto, Kuniyuki Kakushima (Science Tokyo), Yukiharu Uraoka (NAIST)
p. 22

ICD2026-17
Fault Injection into KV Cache of an FPGA-based Transformer and Its Evaluation
Ryo Kumagai, Shu Takemoto, Yusuke Nozaki, Masaya Yoshikawa (Meijo Univ.)
pp. 23 - 27

ICD2026-18
[Invited Talk] Multi-stacked Channels and Doped Source/Drains Toward TMDC CFETs
Shinichi Tanabe (Tokyo Electron Ltd.)
pp. 28 - 29

ICD2026-19
[Invited Talk] A 2.1-μm Pixel-Pitch CMOS Image Sensor with 65% MTF/35% QE IR Global Shutter and RGB Rolling Shutter Sequential Operation for In-cabin Applications
Mizuha Hiroki, Tatsuya Takeuchi, Yuta Nakamoto, Yuki Yoshimura, Hiroki Hagiwara, Ryotaro Takata, Kaihei Hotta (SSS), Yuji Nishimura, Shingo Yamaguchi, Ayumi Takayama (SCK), Ryosuke Nakamura, Takahiro Toyoshima, Yorito Sakano, Yusuke Oike (SSS)
pp. 30 - 33

ICD2026-20
[Invited Talk] 3D Orthogonal Die Stacking Technology for DRAM-on-GPU Integration Using Contactless Die-to-Die Interface
Yuki Mitarai, Hung-Chih Huang, Mototsugu Hamada, Atsutake Kosuge (UTokyo)
pp. 34 - 39

ICD2026-21
[Invited Talk] A Multi-Stacked Cell Array Architecture with Wafer-to-Wafer Cu Direct Bonding for Ultra-High-Density 3D Flash Memory beyond 1,000 Word Lines
Mitsuhiko Noda, Susumu Hashimoto, Ryuta Mizumoto, Mamoru Watanabe, Genki Sawada, Kanta Kawasaki, Masahisa Sonoda, Eiji Kamiya, Tetsu Morooka, Keisuke Nakatsuka, Hiroshi Maejima, Shigeki Kobayashi, Shinji Suzuki (Kioxia), Yukihiro Sakotsubo, Kohei Osawa, Shinya Sato, Teiji Shibasaki, Masahiro Yaegashi, Ryoichi Honma (Sandisk), Masayoshi Tagami, Katsuyuki Sekine (Kioxia)
p. 40

ICD2026-22
Confirmation of Short-Term Synaptic Plasticity Operation Using a Dual-Gate PN-Body Tied SOI-FET
Yukihiko Yamazaki (Kanazawa Inst. of Tech.), Haruki Yonezaki (Kanazawa Inst. of Tech./KIOXIA Corp.), Takayuki Mori, Jiro Ida (Kanazawa Inst. of Tech.)
pp. 41 - 44

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan