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Paper Abstract and Keywords
Presentation 2008-01-17 14:30
[Special Invited Talk] In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution
Yusuke Kanno, Yuki Kondoh (HCRL), Takahiro Irita, Kenji Hirose, Ryo Mori, Yoshihiko Yasu (Renesas Technology, Corp.), Shigenobu Komatsu, Hiroyuki Mizuno (HCRL) CPM2007-136 ICD2007-147
Abstract (in Japanese) (See Japanese page) 
(in English) An in-situ measurement scheme for generating supply-noise maps, which can be conducted while running applications in product-level LSIs, was developed. The design of the on-chip voltage sampling probe is based on a simple ring oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High measurement accuracy is achieved by off-chip digital signal processing and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G-cellular-phone processor. It will thus help in designing power-supply networks and in visually verifying the quality of a power supply.
Keyword (in Japanese) (See Japanese page) 
(in English) in-situ measurement / supply-noise maps / on-chip voltage sampling probe / ring oscillator / off-chip digital signal processing / calibration / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 425, CPM2007-136, pp. 47-52, Jan. 2008.
Paper # CPM2007-136 
Date of Issue 2008-01-10 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2007-136 ICD2007-147

Conference Information
Committee CPM ICD  
Conference Date 2008-01-17 - 2008-01-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To CPM 
Conference Code 2008-01-CPM-ICD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) In-situ measurement of supply-noise maps with millivolt accuracy and nanosecond-order time resolution 
Sub Title (in English)  
Keyword(1) in-situ measurement  
Keyword(2) supply-noise maps  
Keyword(3) on-chip voltage sampling probe  
Keyword(4) ring oscillator  
Keyword(5) off-chip digital signal processing  
Keyword(6) calibration  
Keyword(7)  
Keyword(8)  
1st Author's Name Yusuke Kanno  
1st Author's Affiliation Central Research Laboratory, Hitachi, Ltd. (HCRL)
2nd Author's Name Yuki Kondoh  
2nd Author's Affiliation Central Research Laboratory, Hitachi, Ltd. (HCRL)
3rd Author's Name Takahiro Irita  
3rd Author's Affiliation Renesas Technology, Corporation (Renesas Technology, Corp.)
4th Author's Name Kenji Hirose  
4th Author's Affiliation Renesas Technology, Corporation (Renesas Technology, Corp.)
5th Author's Name Ryo Mori  
5th Author's Affiliation Renesas Technology, Corporation (Renesas Technology, Corp.)
6th Author's Name Yoshihiko Yasu  
6th Author's Affiliation Renesas Technology, Corporation (Renesas Technology, Corp.)
7th Author's Name Shigenobu Komatsu  
7th Author's Affiliation Central Research Laboratory, Hitachi, Ltd. (HCRL)
8th Author's Name Hiroyuki Mizuno  
8th Author's Affiliation Central Research Laboratory, Hitachi, Ltd. (HCRL)
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Speaker Author-1 
Date Time 2008-01-17 14:30:00 
Presentation Time 40 minutes 
Registration for CPM 
Paper # CPM2007-136, ICD2007-147 
Volume (vol) vol.107 
Number (no) no.425(CPM), no.426(ICD) 
Page pp.47-52 
#Pages 6 
Date of Issue 2008-01-10 (CPM, ICD) 

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