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Paper Abstract and Keywords
Presentation 2008-04-23 15:00
Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
Eishi Ibe (PERL) CPSY2008-7 DC2008-7
Abstract (in Japanese) (See Japanese page) 
(in English) Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in
semiconductor devices from late 90s. International defacto- or dejule standards are being established to fix standard test
methods to quantify the vulnerability of the semiconductor devices to such radiation sources. The present paper summarizes
the current status of the error modes, experimental and simulation/analysis methods, and possible/existing countermeasures.
Keyword (in Japanese) (See Japanese page) 
(in English) ｎｅｕｔｒｏｎ / soft-error / SEFI / MCU / MCBI / multi-node upset / /  
Reference Info. IEICE Tech. Rep., vol. 108, no. 15, DC2008-7, pp. 37-42, April 2008.
Paper # DC2008-7 
Date of Issue 2008-04-16 (CPSY, DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPSY2008-7 DC2008-7

Conference Information
Committee DC CPSY  
Conference Date 2008-04-23 - 2008-04-23 
Place (in Japanese) (See Japanese page) 
Place (in English) Tokyo Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Dependable Computing Systems, etc. 
Paper Information
Registration To DC 
Conference Code 2008-04-DC-CPSY 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems 
Sub Title (in English)  
Keyword(1) ｎｅｕｔｒｏｎ  
Keyword(2) soft-error  
Keyword(3) SEFI  
Keyword(4) MCU  
Keyword(5) MCBI  
Keyword(6) multi-node upset  
Keyword(7)  
Keyword(8)  
1st Author's Name Eishi Ibe  
1st Author's Affiliation Production Engineering Research Laboratory, Hitachi, Ltd.. (PERL)
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Speaker Author-1 
Date Time 2008-04-23 15:00:00 
Presentation Time 30 minutes 
Registration for DC 
Paper # CPSY2008-7, DC2008-7 
Volume (vol) vol.108 
Number (no) no.14(CPSY), no.15(DC) 
Page pp.37-42 
#Pages 6 
Date of Issue 2008-04-16 (CPSY, DC) 

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