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Paper Abstract and Keywords
Presentation 2011-02-18 15:50
Statistical Quality Control based on Early Life Failure Rate for Electronic Components
Toshinari Matsuoka (MELCO) R2010-48 EMD2010-149 Link to ES Tech. Rep. Archives: EMD2010-149
Abstract (in Japanese) (See Japanese page) 
(in English) Basically, a manufacturing process of electronic components is complex and demanding.Therefore, in order to achieve a quality target, it is difficult to control variation of manufacturing condition only depending on manufacturing capability.Accordingly, it is required to establish some repeated screening processes such as inspection and aging, so as to prevent any outflow of units which have shorter life duration than a target.In other words, for electronic components, the useful life and the quality in field (Early Life Failure Rate) is heavily dependent on the screening capability.Moreover, in order to achieve a quality target, it is required to validate the capability at the prototype stage, so as to reflect it as a control standard for a performance data at an inspection process any later than mass production starts.
Keyword (in Japanese) (See Japanese page) 
(in English) EFR / SQC / Hazard / Weibull / Qualification / / /  
Reference Info. IEICE Tech. Rep., vol. 110, no. 415, R2010-48, pp. 37-42, Feb. 2011.
Paper # R2010-48 
Date of Issue 2011-02-11 (R, EMD) 
ISSN Print edition: ISSN 0913-5685  Online edition: ISSN 2432-6380
Copyright
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reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2010-48 EMD2010-149 Link to ES Tech. Rep. Archives: EMD2010-149

Conference Information
Committee EMD R  
Conference Date 2011-02-18 - 2011-02-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Shizuoka Univ. (Hamamatsu) 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To R 
Conference Code 2011-02-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Statistical Quality Control based on Early Life Failure Rate for Electronic Components 
Sub Title (in English)  
Keyword(1) EFR  
Keyword(2) SQC  
Keyword(3) Hazard  
Keyword(4) Weibull  
Keyword(5) Qualification  
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1st Author's Name Toshinari Matsuoka  
1st Author's Affiliation MitsubishiElectric corp. (MELCO)
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Speaker Author-1 
Date Time 2011-02-18 15:50:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2010-48, EMD2010-149 
Volume (vol) vol.110 
Number (no) no.415(R), no.416(EMD) 
Page pp.37-42 
#Pages
Date of Issue 2011-02-11 (R, EMD) 


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