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| Presentation | 2011-11-10 14:40 [Invited Talk] Device Simulation of STM Carrier Profiling Koichi Fukuda, Masayasu Nishizawa, Tetsuya Tada (AIST), Leonid Bolotov (Tsukuba Univ.), Kaina Suzuki, Shigeo Sato (Fujitsu Semiconductor), Hiroshi Arimoto, Toshihiko Kanayama (AIST)  SDM2011-119 Link to ES Tech. Rep. Archives: SDM2011-119 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | (Not available yet) | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | / / / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 111, no. 281, SDM2011-119, pp. 21-26, Nov. 2011. | |
| Paper # | SDM2011-119 | |
| Date of Issue | 2011-11-03 (SDM) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SDM2011-119 Link to ES Tech. Rep. Archives: SDM2011-119 |
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| Conference Information | |
| Committee | SDM |
| Conference Date | 2011-11-10 - 2011-11-11 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg. |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Process, Device, Circuit Simulations, etc |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2011-11-SDM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Device Simulation of STM Carrier Profiling |
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| 1st Author's Name | Koichi Fukuda |
| 1st Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 2nd Author's Name | Masayasu Nishizawa |
| 2nd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 3rd Author's Name | Tetsuya Tada |
| 3rd Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 4th Author's Name | Leonid Bolotov |
| 4th Author's Affiliation | Tsukuba University (Tsukuba Univ.) |
| 5th Author's Name | Kaina Suzuki |
| 5th Author's Affiliation | Fujitsu Semiconductor Ltd. (Fujitsu Semiconductor) |
| 6th Author's Name | Shigeo Sato |
| 6th Author's Affiliation | Fujitsu Semiconductor Ltd. (Fujitsu Semiconductor) |
| 7th Author's Name | Hiroshi Arimoto |
| 7th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
| 8th Author's Name | Toshihiko Kanayama |
| 8th Author's Affiliation | National Institute of Advanced Industrial Science and Technology (AIST) |
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| Speaker | Author-1 |
| Date Time | 2011-11-10 14:40:00 |
| Presentation Time | 50 minutes |
| Registration for | SDM |
| Paper # | SDM2011-119 |
| Volume (vol) | vol.111 |
| Number (no) | no.281 |
| Page | pp.21-26 |
| #Pages | 6 |
| Date of Issue | 2011-11-03 (SDM) |
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