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Paper Abstract and Keywords
Presentation 2012-10-27 09:35
Examination of underlayer for SrAl2O4: Eu, Dy thin films by annealing methods
Kazuaki Kobayashi, Hidehiko Shimizu, Haruo Iwano, Yasuo Fukushima, Takahiro Kawakami (Niigata Univ.) CPM2012-105
Abstract (in Japanese) (See Japanese page) 
(in English) In order to examine characteristics of the thin films, SrAl2O4: Eu, Dy thin films were attempted by post-annealing in Ar+5%H2 about 50 Pa of the films deposited using the facing target sputtering (FTS) method in room temperature on the oxidized Al underlayer deposited by the magnetron sputtering (MS) method in room temperature. As a result, adjustment of thickness with oxided Al underlayer and oxygen partial pressure, when oxidized Al underlayer was deposited, was effective improvement of crystallinity and photoluminescence, and suppression of detachment and crack.
Keyword (in Japanese) (See Japanese page) 
(in English) SrAl2O4: Eu, Dy thin films / oxidized Al underlayer / long-lasting phosphorescence / sputtering methods / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 265, CPM2012-105, pp. 65-69, Oct. 2012.
Paper # CPM2012-105 
Date of Issue 2012-10-19 (CPM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee CPM  
Conference Date 2012-10-26 - 2012-10-27 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To CPM 
Conference Code 2012-10-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Examination of underlayer for SrAl2O4: Eu, Dy thin films by annealing methods 
Sub Title (in English)  
Keyword(1) SrAl2O4: Eu, Dy thin films  
Keyword(2) oxidized Al underlayer  
Keyword(3) long-lasting phosphorescence  
Keyword(4) sputtering methods  
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Keyword(6)  
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Keyword(8)  
1st Author's Name Kazuaki Kobayashi  
1st Author's Affiliation Niigata University (Niigata Univ.)
2nd Author's Name Hidehiko Shimizu  
2nd Author's Affiliation Niigata University (Niigata Univ.)
3rd Author's Name Haruo Iwano  
3rd Author's Affiliation Niigata University (Niigata Univ.)
4th Author's Name Yasuo Fukushima  
4th Author's Affiliation Niigata University (Niigata Univ.)
5th Author's Name Takahiro Kawakami  
5th Author's Affiliation Niigata University (Niigata Univ.)
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Speaker Author-1 
Date Time 2012-10-27 09:35:00 
Presentation Time 25 minutes 
Registration for CPM 
Paper # CPM2012-105 
Volume (vol) vol.112 
Number (no) no.265 
Page pp.65-69 
#Pages 5 
Date of Issue 2012-10-19 (CPM) 

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