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Paper Abstract and Keywords
Presentation 2013-02-13 16:40
Data volume reduction method for unknown value handling in built-in self test used in field
Yuta Yoshimi (NAIST), Kazumi Hatayama, Yuta Yamato, Tomokazu Yoneda, Michiko Inoue (NAIST/JST) DC2012-90
Abstract (in Japanese) (See Japanese page) 
(in English) Many approaches on test pattern compression targeted unknown value handling. It is because unknown values have impacts on compression efficiency and test quality. A similar problem happens when built-in self test(BIST) is used in field where we should also consider test constraints, such as test data volume, test application time and so on. This paper focuses on the reduction of test data volume. We utilize an unknown values handling approach called X-canceling, and propose a method which uses a common X-canceling timing to reduce data volume for X-canceling operation.
Keyword (in Japanese) (See Japanese page) 
(in English) Built-in Self Test / BIST / Unknown Value Handling / Field Reliability / / / /  
Reference Info. IEICE Tech. Rep., vol. 112, no. 429, DC2012-90, pp. 61-66, Feb. 2013.
Paper # DC2012-90 
Date of Issue 2013-02-06 (DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee DC  
Conference Date 2013-02-13 - 2013-02-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) VLSI Design and Test, etc. 
Paper Information
Registration To DC 
Conference Code 2013-02-DC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Data volume reduction method for unknown value handling in built-in self test used in field 
Sub Title (in English)  
Keyword(1) Built-in Self Test  
Keyword(2) BIST  
Keyword(3) Unknown Value Handling  
Keyword(4) Field Reliability  
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1st Author's Name Yuta Yoshimi  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Kazumi Hatayama  
2nd Author's Affiliation Nara Institute of Science and Technology/Japan Science and Technology (NAIST/JST)
3rd Author's Name Yuta Yamato  
3rd Author's Affiliation Nara Institute of Science and Technology/Japan Science and Technology (NAIST/JST)
4th Author's Name Tomokazu Yoneda  
4th Author's Affiliation Nara Institute of Science and Technology/Japan Science and Technology (NAIST/JST)
5th Author's Name Michiko Inoue  
5th Author's Affiliation Nara Institute of Science and Technology/Japan Science and Technology (NAIST/JST)
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Speaker Author-1 
Date Time 2013-02-13 16:40:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2012-90 
Volume (vol) vol.112 
Number (no) no.429 
Page pp.61-66 
#Pages 6 
Date of Issue 2013-02-06 (DC) 

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