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Paper Abstract and Keywords
Presentation 2014-12-12 17:00
Atomic Layer Deposition of Al2O3 Film Utilizing Water Vapor Plasma Oxidation
Tomoaki Umehara, Masahiro Horita, Koji Yoshitsugu, Yasuaki Ishikawa, Yukiharu Uraoka (NAIST) EID2014-36 SDM2014-131 Link to ES Tech. Rep. Archives: EID2014-36 SDM2014-131
Abstract (in Japanese) (See Japanese page) 
(in English) In this paper, we reported Al2O3 insulation film deposited by atomic layer deposition(ALD) for application of GaN power devices. In the ALD for Al2O3 film deposition, we sugested to deposit Al2O3 film using plasma originated from water vapor for the oxidation process. We confirmed that the water vapor plasma assisted ALD leads to an increase in breakdown field and a decrease in gate leak current compared with the conventional thermal-ALD Al2O3 film. Optical emission spectrometry reveals that active species originated form water vapor were generated, which may contributes to the reaction.
Keyword (in Japanese) (See Japanese page) 
(in English) Plasma assisted-atomic layer deposition / Al2O3 / water vapor plasma / / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 360, SDM2014-131, pp. 119-123, Dec. 2014.
Paper # SDM2014-131 
Date of Issue 2014-12-05 (EID, SDM) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF EID2014-36 SDM2014-131 Link to ES Tech. Rep. Archives: EID2014-36 SDM2014-131

Conference Information
Committee SDM EID  
Conference Date 2014-12-12 - 2014-12-12 
Place (in Japanese) (See Japanese page) 
Place (in English) Kyoto University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Si and Si-related Materials and Devices, Display Technology 
Paper Information
Registration To SDM 
Conference Code 2014-12-SDM-EID 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Atomic Layer Deposition of Al2O3 Film Utilizing Water Vapor Plasma Oxidation 
Sub Title (in English)  
Keyword(1) Plasma assisted-atomic layer deposition  
Keyword(2) Al2O3  
Keyword(3) water vapor plasma  
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1st Author's Name Tomoaki Umehara  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Masahiro Horita  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Koji Yoshitsugu  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name Yasuaki Ishikawa  
4th Author's Affiliation Nara Institute of Science and Technology (NAIST)
5th Author's Name Yukiharu Uraoka  
5th Author's Affiliation Nara Institute of Science and Technology (NAIST)
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Speaker Author-1 
Date Time 2014-12-12 17:00:00 
Presentation Time 15 minutes 
Registration for SDM 
Paper # EID2014-36, SDM2014-131 
Volume (vol) vol.114 
Number (no) no.359(EID), no.360(SDM) 
Page pp.119-123 
#Pages
Date of Issue 2014-12-05 (EID, SDM) 


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