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Paper Abstract and Keywords
Presentation 2016-01-20 15:30
Analysis of Millimeter Wave Oscillation in GaN HEMT Unit Cell
Shinsuke Watanabe, Shouhei Imai, Eigo Kuwata, Hidetoshi Koyama, Yoshitaka Kamo, Yoshitsugu Yamamoto (Mitsubishi Electric) ED2015-119
Abstract (in Japanese) (See Japanese page) 
(in English) A millimeter wave oscillation was observed in GaN HEMT unit cell. To prevent this oscillation, we performed electromagnetic field analysis for HEMT. Calculated resonant frequency corresponded to measured oscillation frequency. Estimated electromagnetic field of resonant state distributes anti-symmetrically with respect to a center finger, and this result of our analysis clearly shows that the millimeter wave oscillation results from odd mode oscillation in the unit cell. Additionally, this analysis suggested that connection of edges of each source electrodes prevents the odd mode resonance. We fabricated HEMT TEG with connected edges of source electrodes, and the oscillation was successfully prevented maintaining the performance.
Keyword (in Japanese) (See Japanese page) 
(in English) GaN / HEMT / Oscillation / Electromagnetic field analysis / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 402, ED2015-119, pp. 43-48, Jan. 2016.
Paper # ED2015-119 
Date of Issue 2016-01-13 (ED) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF ED2015-119

Conference Information
Committee ED  
Conference Date 2016-01-20 - 2016-01-20 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Power Devices and High-frequency Devices, Microwave, etc. 
Paper Information
Registration To ED 
Conference Code 2016-01-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysis of Millimeter Wave Oscillation in GaN HEMT Unit Cell 
Sub Title (in English)  
Keyword(1) GaN  
Keyword(2) HEMT  
Keyword(3) Oscillation  
Keyword(4) Electromagnetic field analysis  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Shinsuke Watanabe  
1st Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric)
2nd Author's Name Shouhei Imai  
2nd Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric)
3rd Author's Name Eigo Kuwata  
3rd Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric)
4th Author's Name Hidetoshi Koyama  
4th Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric)
5th Author's Name Yoshitaka Kamo  
5th Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric)
6th Author's Name Yoshitsugu Yamamoto  
6th Author's Affiliation Mitsubishi Electric Corporation (Mitsubishi Electric)
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Speaker Author-1 
Date Time 2016-01-20 15:30:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2015-119 
Volume (vol) vol.115 
Number (no) no.402 
Page pp.43-48 
#Pages 6 
Date of Issue 2016-01-13 (ED) 

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