Paper Abstract and Keywords |
Presentation |
2018-03-02 09:45
Single-Electron Devices Fabricated Using Gold Nanoparticles on Silane-Treated Substrates Tomoki Yagai, Kazuhiko Matsumoto, Makoto Moribayashi, Masataka Moriya, Hiroshi Shimada (UEC Tokyo), Ayumi Hirano-Iwata (Tohoku Univ.), Fumihiko Hirose (Yamagata Univ.), Yoshinao Mizugaki (UEC Tokyo) CPM2017-128 Link to ES Tech. Rep. Archives: CPM2017-128 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
We report dispersed gold nanoparticles (GNP) 2D arrays fabricated by immersing silane-treated substrates into colloidal gold solution. It is well known inter-particles distance is important for application to nanodevices. In this method, inter-particle distance, which was an important parameter for nano-device applications, was controlled by immersion time and the thickness of electric double layer. We also attempted to fabricate a single-electron device comprising random arrays of GNP. We made second dispersion after treating the substrate surface with dithiol. We demonstrated that GNP arrays worked as thiol-connected tunnel junctions, resulting in observation of the Coulomb blockade phenomenon. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Colloidal gold solution / Electric double layer / Thiol / Coulomb blockade / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 117, no. 461, CPM2017-128, pp. 49-52, March 2018. |
Paper # |
CPM2017-128 |
Date of Issue |
2018-02-22 (CPM) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Download PDF |
CPM2017-128 Link to ES Tech. Rep. Archives: CPM2017-128 |