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| Presentation | 2021-11-12 17:10 Inference of MOSFET Characteristics and Parameters with Machine Learning Kohei Akazawa, Yuigo Nakanishi, Yuhei Suzuki, Yoshinari Kamakura (Osaka Inst. Technol.)  SDM2021-67 Link to ES Tech. Rep. Archives: SDM2021-67 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | A machine learning method to extract SPICE model parameters is discussed. The data set is obtained from SPICE simulation by varying the parameters for BSIM4 MOSFET model. The model based on the convolutional autoencoder (CAE) is used to predict the SPICE parameters from the input image (i.e., MOSFET I-V characteristics), which shows a better performance compared to the linear regression model due to its ability to reduce overfitting. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | machine learning / SPICE parameter extraction / MOSFET / autoencoder / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 121, no. 235, SDM2021-67, pp. 77-80, Nov. 2021. | |
| Paper # | SDM2021-67 | |
| Date of Issue | 2021-11-04 (SDM) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | SDM2021-67 Link to ES Tech. Rep. Archives: SDM2021-67 |
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| Conference Information | |
| Committee | SDM |
| Conference Date | 2021-11-11 - 2021-11-12 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Online |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Process, Device, Circuit simulation, etc. |
| Paper Information | |
| Registration To | SDM |
| Conference Code | 2021-11-SDM |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | Inference of MOSFET Characteristics and Parameters with Machine Learning |
| Sub Title (in English) | |
| Keyword(1) | machine learning |
| Keyword(2) | SPICE parameter extraction |
| Keyword(3) | MOSFET |
| Keyword(4) | autoencoder |
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| 1st Author's Name | Kohei Akazawa |
| 1st Author's Affiliation | Osaka Institute of Technology (Osaka Inst. Technol.) |
| 2nd Author's Name | Yuigo Nakanishi |
| 2nd Author's Affiliation | Osaka Institute of Technology (Osaka Inst. Technol.) |
| 3rd Author's Name | Yuhei Suzuki |
| 3rd Author's Affiliation | Osaka Institute of Technology (Osaka Inst. Technol.) |
| 4th Author's Name | Yoshinari Kamakura |
| 4th Author's Affiliation | Osaka Institute of Technology (Osaka Inst. Technol.) |
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| Speaker | Author-1 |
| Date Time | 2021-11-12 17:10:00 |
| Presentation Time | 25 minutes |
| Registration for | SDM |
| Paper # | SDM2021-67 |
| Volume (vol) | vol.121 |
| Number (no) | no.235 |
| Page | pp.77-80 |
| #Pages | 4 |
| Date of Issue | 2021-11-04 (SDM) |
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