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| Presentation | 2023-02-28 16:15 A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability Ruijun Ma (AUST), Stefan Holst, Xiaoqing Wen (KIT), Hui Xu (AUST), Aibin Yan (AU)  DC2022-91 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | The continuous pursuing of smaller technology nodes makes modern Integrated Circuits (ICs) more and more susceptible to soft-errors. Many radiation-hardened latch designs have been proposed to tolerate soft-errors for reliable LSI designs. However, these existing hardened latches can suffer from reliability issues after production because production defects in such hardened latches are difficult to detect with conventional scan testing. In our previous works, we improved the defect detectability of these hardened latches by adding design-for-test (DFT) technique. A hardened latch design, called high performance scan-test-aware hardened latch (HP-STAHL), was proposed for higher defect detectability, higher soft-error tolerability, and lower propagation delay. However, the added DFT structure in HP-STAHL can partially reduce its soft-error tolerability. In this paper, we propose a novel high performance scan-test-aware hardened latch design with improved soft-error tolerability (HP-STAHL-I) by applying a novel design to offset the reduced soft-error tolerability. Simulation results show that HP-STAHL-I provides higher soft-error tolerability than HP-STAHL. HP-STAHL-I also has lower delay and power delay product (PDP) than the standard latch, demonstrating its high performance. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | soft-error / hardened latch / defect / scan test / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 122, no. 393, DC2022-91, pp. 51-55, Feb. 2023. | |
| Paper # | DC2022-91 | |
| Date of Issue | 2023-02-21 (DC) | |
| ISSN | Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | DC2022-91 |
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| Conference Information | |
| Committee | DC |
| Conference Date | 2023-02-28 - 2023-02-28 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kikai-Shinko-Kaikan Bldg |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | |
| Paper Information | |
| Registration To | DC |
| Conference Code | 2023-02-DC |
| Language | English |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A Novel High Performance Scan-Test-Aware Hardened Latch with Improved Soft Error Tolerability |
| Sub Title (in English) | |
| Keyword(1) | soft-error |
| Keyword(2) | hardened latch |
| Keyword(3) | defect |
| Keyword(4) | scan test |
| Keyword(5) | |
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| 1st Author's Name | Ruijun Ma |
| 1st Author's Affiliation | Anhui University of Science and Technology (AUST) |
| 2nd Author's Name | Stefan Holst |
| 2nd Author's Affiliation | Kyushu Institute of Technology (KIT) |
| 3rd Author's Name | Xiaoqing Wen |
| 3rd Author's Affiliation | Kyushu Institute of Technology (KIT) |
| 4th Author's Name | Hui Xu |
| 4th Author's Affiliation | Anhui University of Science and Technology (AUST) |
| 5th Author's Name | Aibin Yan |
| 5th Author's Affiliation | Anhui University (AU) |
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| Speaker | Author-1 |
| Date Time | 2023-02-28 16:15:00 |
| Presentation Time | 25 minutes |
| Registration for | DC |
| Paper # | DC2022-91 |
| Volume (vol) | vol.122 |
| Number (no) | no.393 |
| Page | pp.51-55 |
| #Pages | 5 |
| Date of Issue | 2023-02-21 (DC) |
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