Paper Abstract and Keywords |
Presentation |
2023-02-28 15:15
A Seed Generation Method for Multiple Random Pattern Resistant Transition Faults for BIST Yangling Xu, Rei Miura, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (KSU) DC2022-89 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
With shrinking feature sizes, growing clock frequencies, and decreasing power supply voltage, modern very large integrated circuits are increasingly suffering from the impact of timing related defects. Therefore, testing for transition faults is necessary. It is important to reduce test cost and improve test quality to deal with the complexity of fault models. To resolve this problem, built-in self-test (BIST) technique is widely used. However, since BIST uses pseudo-random pattern testing, fault coverage is not high due to the existence of random pattern resistant faults. Therefore, in BIST, reseed techniques have been proposed and one-pass seed generation methods which deal with the model combined the functions of the circuit under test and the pseudo-random pattern generator. In this paper, to reduce the number of seeds we use a pseudo-Boolean optimization (PBO) to generate seeds for multiple target faults and PBO maximizes the number of detected target faults. Furthermore, to ensure that the test patterns applied from the generated seed are capture-safe, we propose a one-pass seed generation method for multiple target faults with a power consumption threshold constraint using PBO. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
BIST / transition faults / seed generation / Pseudo-Boolean optimization / low power consumption / / / |
Reference Info. |
IEICE Tech. Rep., vol. 122, no. 393, DC2022-89, pp. 39-44, Feb. 2023. |
Paper # |
DC2022-89 |
Date of Issue |
2023-02-21 (DC) |
ISSN |
Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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DC2022-89 |
Conference Information |
Committee |
DC |
Conference Date |
2023-02-28 - 2023-02-28 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kikai-Shinko-Kaikan Bldg |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
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Paper Information |
Registration To |
DC |
Conference Code |
2023-02-DC |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Seed Generation Method for Multiple Random Pattern Resistant Transition Faults for BIST |
Sub Title (in English) |
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Keyword(1) |
BIST |
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transition faults |
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seed generation |
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Pseudo-Boolean optimization |
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low power consumption |
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1st Author's Name |
Yangling Xu |
1st Author's Affiliation |
Nihon university (Nihon Univ) |
2nd Author's Name |
Rei Miura |
2nd Author's Affiliation |
Nihon university (Nihon Univ) |
3rd Author's Name |
Toshinori Hosokawa |
3rd Author's Affiliation |
Nihon university (Nihon Univ) |
4th Author's Name |
Masayoshi Yoshimura |
4th Author's Affiliation |
Kyoto Sangyo University (KSU) |
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Speaker |
Author-3 |
Date Time |
2023-02-28 15:15:00 |
Presentation Time |
25 minutes |
Registration for |
DC |
Paper # |
DC2022-89 |
Volume (vol) |
vol.122 |
Number (no) |
no.393 |
Page |
pp.39-44 |
#Pages |
6 |
Date of Issue |
2023-02-21 (DC) |
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