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Paper Abstract and Keywords
Presentation 2023-02-28 13:25
A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints
Lele Jiang, Tatsuhiro Tsuchiya (Osaka Univ.) DC2022-85
Abstract (in Japanese) (See Japanese page) 
(in English) This paper focuses on the problem of constraint representation for the generation of t-way test sequences.
T-way sequence testing is a technique for testing event-driven systems.
This technique tests all combinations of t events in all possible orders.
Event-driven systems often have constraints on the order of executable events that must be satisfied by every test case.
To express the constraints, we propose a notation that is easy to understand as well as machine-readable.
The proposed notation only uses basic mathematical operators, thus allowing users to express complex constraints without understanding special operators.
We develop a system that automatically generates a set of test cases that meet the constraints represented in the proposed notation.
From the results of applying the system to a real-life case study, it is found the notation is intuitive and easy to understand and that the system can generate test cases within a practical time.
Keyword (in Japanese) (See Japanese page) 
(in English) Test Sequence Generation / Sequencing Constraint / T-way Sequence Coverage / Sequence Testing / Event-based Testing / Combinatorial Testing / /  
Reference Info. IEICE Tech. Rep., vol. 122, no. 393, DC2022-85, pp. 16-20, Feb. 2023.
Paper # DC2022-85 
Date of Issue 2023-02-21 (DC) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF DC2022-85

Conference Information
Committee DC  
Conference Date 2023-02-28 - 2023-02-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To DC 
Conference Code 2023-02-DC 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints 
Sub Title (in English)  
Keyword(1) Test Sequence Generation  
Keyword(2) Sequencing Constraint  
Keyword(3) T-way Sequence Coverage  
Keyword(4) Sequence Testing  
Keyword(5) Event-based Testing  
Keyword(6) Combinatorial Testing  
Keyword(7)  
Keyword(8)  
1st Author's Name Lele Jiang  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Tatsuhiro Tsuchiya  
2nd Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2023-02-28 13:25:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # DC2022-85 
Volume (vol) vol.122 
Number (no) no.393 
Page pp.16-20 
#Pages 5 
Date of Issue 2023-02-21 (DC) 

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