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Paper Abstract and Keywords
Presentation 2023-08-01 10:40
Review of Characterization of Metal/GaN Schottky Contacts
Kenji Shiojima (Univ. of Fukui) CPM2023-21
Abstract (in Japanese) (See Japanese page) 
(in English) This paper reviews innovation of metal/GaN contacts from the aspects of crystal quality, process technique, and basic understanding of the electrical characteristics. Five topics; (i) thermal degradation of refractory metal contacts, (ii) correlation between dislocations and electrical characteristics, (iii) large-barrier p-GaN Schottky contacts by reducing Mg doping level, (iv) exploring ideal metal/GaN interfaces by cleaving, surface treatment, and post metallization annealing, (v) two-dimensional characterization using our original method: scanning internal photoemission microscopy will be presented.
Keyword (in Japanese) (See Japanese page) 
(in English) GaN / Schottky contacts / Crystal defects / Two-dimensional characterization / Scanning internal photoemission microscopy / / /  
Reference Info. IEICE Tech. Rep., vol. 123, no. 142, CPM2023-21, pp. 36-39, July 2023.
Paper # CPM2023-21 
Date of Issue 2023-07-24 (CPM) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CPM2023-21

Conference Information
Committee CPM  
Conference Date 2023-07-31 - 2023-08-01 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To CPM 
Conference Code 2023-07-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Review of Characterization of Metal/GaN Schottky Contacts 
Sub Title (in English)  
Keyword(1) GaN  
Keyword(2) Schottky contacts  
Keyword(3) Crystal defects  
Keyword(4) Two-dimensional characterization  
Keyword(5) Scanning internal photoemission microscopy  
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1st Author's Name Kenji Shiojima  
1st Author's Affiliation University of Fukui (Univ. of Fukui)
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Speaker Author-1 
Date Time 2023-08-01 10:40:00 
Presentation Time 30 minutes 
Registration for CPM 
Paper # CPM2023-21 
Volume (vol) vol.123 
Number (no) no.142 
Page pp.36-39 
#Pages 4 
Date of Issue 2023-07-24 (CPM) 

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