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Paper Abstract and Keywords
Presentation 2024-08-29 13:30
*
Masashi Watanabe, Nao Ishii, Seiya Abe, Hideki Nakazawa, Yasuyuki Kobayashi (hirosaki Univ.) R2024-12 EMD2024-6 CPM2024-22 OPE2024-62 LQE2024-9
Abstract (in Japanese) (See Japanese page) 
(in English) High-quality hexagonal boron nitride (h-BN) thin films can be grown on Ni(111) because of small lattice mismatch of 0.4%. Dewetting of Ni(111) thin films on sapphire substrates causes deterioration of the Ni(111) surfaces, therefore thicker Ni(111) films are required to suppress the dewetting phenomenon. In this study, we grew Ni(111) thin films with the thickness of 50 to 500 nm on sapphire(0001) substrates by electron beam deposition. X-ray diffraction revealed that the orientation relationship was OR-I and atomic force microscopy identified that Ni(111) surfaces showed flat surfaces with RMS roughness of 0.7 nm to 3.0 nm.
Keyword (in Japanese) (See Japanese page) 
(in English) Ni(111) thin film / Sapphire substrate / Electron beam deposition / X-ray diffraction / Atomic force microscopy / / /  
Reference Info. IEICE Tech. Rep., vol. 124, no. 169, CPM2024-22, pp. 1-4, Aug. 2024.
Paper # CPM2024-22 
Date of Issue 2024-08-22 (R, EMD, CPM, OPE, LQE) 
ISSN Online edition: ISSN 2432-6380
Copyright
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reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2024-12 EMD2024-6 CPM2024-22 OPE2024-62 LQE2024-9

Conference Information
Committee CPM LQE OPE EMD R  
Conference Date 2024-08-29 - 2024-08-30 
Place (in Japanese) (See Japanese page) 
Place (in English) Hirosaki University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Photodetectors, Modulators, Optical Electrical device packaging and reliability 
Paper Information
Registration To CPM 
Conference Code 2024-08-CPM-LQE-OPE-EMD-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) * 
Sub Title (in English)  
Keyword(1) Ni(111) thin film  
Keyword(2) Sapphire substrate  
Keyword(3) Electron beam deposition  
Keyword(4) X-ray diffraction  
Keyword(5) Atomic force microscopy  
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1st Author's Name Masashi Watanabe  
1st Author's Affiliation Hirosaki University (hirosaki Univ.)
2nd Author's Name Nao Ishii  
2nd Author's Affiliation Hirosaki University (hirosaki Univ.)
3rd Author's Name Seiya Abe  
3rd Author's Affiliation Hirosaki University (hirosaki Univ.)
4th Author's Name Hideki Nakazawa  
4th Author's Affiliation Hirosaki University (hirosaki Univ.)
5th Author's Name Yasuyuki Kobayashi  
5th Author's Affiliation Hirosaki University (hirosaki Univ.)
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Speaker Author-1 
Date Time 2024-08-29 13:30:00 
Presentation Time 25 minutes 
Registration for CPM 
Paper # R2024-12, EMD2024-6, CPM2024-22, OPE2024-62, LQE2024-9 
Volume (vol) vol.124 
Number (no) no.167(R), no.168(EMD), no.169(CPM), no.170(OPE), no.171(LQE) 
Page pp.1-4 
#Pages 4 
Date of Issue 2024-08-22 (R, EMD, CPM, OPE, LQE) 

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