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Paper Abstract and Keywords
Presentation 2026-06-20 11:20
Reading span in a Maze: A pilot study
Seinosuke Tomishima, Kentaro Nakatani (Konan U), Shotaro Noda (Hiroo Gakuen) TL2026-3
Abstract (in Japanese) (See Japanese page) 
(in English) It has been suggested that sentence processing is influenced by various capacity-related factors, including working memory—a cognitive resource used to maintain and manipulate (often multiple types of) information in mind. A widely used method for measuring working memory is the Reading Span Test (RST; Daneman & Carpenter, 1980; Just & Carpenter, 1992, etc.), in which participants are asked to memorize words while reading sentences. Participants are often instructed to read the sentences aloud to ensure engagement with the reading task and to prevent them from prioritizing the word-memorization component of the test. Alternatively, comprehension questions may be used for this purpose. We propose a different approach to replace these methods: implementing a Maze method (Forster et al., 2009; Witzel et al., 2012; Boyce et al., 2020) for the reading component of the RST. In a Maze-driven self-paced reading task, participants are continuously required to select the correct word, which prevents them from bypassing the reading process. If this method proves effective, it may open up the possibility of administering the RST online. We present results from a pilot study comparing a Maze-driven Japanese RST with a traditional RST.
Keyword (in Japanese) (See Japanese page) 
(in English) working memory / reading span test / maze / Japanese / / / /  
Reference Info. IEICE Tech. Rep., vol. 126, no. 80, TL2026-3, pp. 13-18, June 2026.
Paper # TL2026-3 
Date of Issue 2026-06-13 (TL) 
ISSN Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF TL2026-3

Conference Information
Committee TL  
Conference Date 2026-06-20 - 2026-06-21 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Language Processing and Language Learning 
Paper Information
Registration To TL 
Conference Code 2026-06-TL 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Reading span in a Maze: A pilot study 
Sub Title (in English)  
Keyword(1) working memory  
Keyword(2) reading span test  
Keyword(3) maze  
Keyword(4) Japanese  
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1st Author's Name Seinosuke Tomishima  
1st Author's Affiliation Konan University (Konan U)
2nd Author's Name Kentaro Nakatani  
2nd Author's Affiliation Konan University (Konan U)
3rd Author's Name Shotaro Noda  
3rd Author's Affiliation Hiroo Gakuen High School (Hiroo Gakuen)
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Speaker Author-1 
Date Time 2026-06-20 11:20:00 
Presentation Time 30 minutes 
Registration for TL 
Paper # TL2026-3 
Volume (vol) vol.126 
Number (no) no.80 
Page pp.13-18 
#Pages 6 
Date of Issue 2026-06-13 (TL) 

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