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Technical Committee on Silicon Device and Materials (SDM) (Searched in: 2017)
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Search Results: Keywords 'from:2017-06-20 to:2017-06-20'
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Ascending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2017-06-20 13:00 |
Tokyo |
Campus Innovation Center Tokyo |
[Invited Lecture]
Scintillators and Ga2O3 Semiconductors Go Okada, Yuki Usui, Naoki Kawano, Noriaki Kawaguchi, Takayuki Yanagida (NAIST) SDM2017-21 |
With the recent advancement of radiation-detection technologies, the demands of higher performances of scintillators are... [more] |
SDM2017-21 pp.1-4 |
SDM |
2017-06-20 13:20 |
Tokyo |
Campus Innovation Center Tokyo |
[Invited Lecture]
Development of Quantum Imaging Detector using SOI Technology
-- Looking Elementary Particles and X-rays with Semiconductor -- Yasuo Arai (KEK) SDM2017-22 |
Silicon is a good material for detecting quantum beam (Photon, X-ray, Gamma-ray, Electron, Ion, Neutron etc.) and also g... [more] |
SDM2017-22 pp.5-8 |
SDM |
2017-06-20 13:40 |
Tokyo |
Campus Innovation Center Tokyo |
[Invited Lecture]
Studies on semiconducting gas sensors with WO3 nanoparticles for skin-emitted acetone detection Yuki Yamada, Satoshi Hiyama (NTT DOCOMO), Hitoshi Tabata (Univ. of Tokyo) SDM2017-23 |
(To be available after the conference date) [more] |
SDM2017-23 pp.9-13 |
SDM |
2017-06-20 14:00 |
Tokyo |
Campus Innovation Center Tokyo |
[Invited Lecture]
Sensing technologies using nitrogen-vacancy centers in diamond Takayuki Iwasaki, Mutsuko Hatano (Tokyo Inst. of Tech.) SDM2017-24 |
[more] |
SDM2017-24 pp.15-18 |
SDM |
2017-06-20 14:35 |
Tokyo |
Campus Innovation Center Tokyo |
Direct Observation of Chemical Structure and Electrical Dipole at High-k/SiO2 Interface Using by XPS Measurements Nobuyuki Fujimura, Akio Ohta, Mitsuhisa Ikeda, Katsunori Makihara, Seiichi Miyazaki (Nagoya Univ.) SDM2017-25 |
[more] |
SDM2017-25 pp.19-23 |
SDM |
2017-06-20 14:55 |
Tokyo |
Campus Innovation Center Tokyo |
Resistive Switching Properties of Si Oxide by Constant Voltage and Constant Current Application Akio Ohta, Yusuke Kato, Mitsuhisa Ikeda, Katsunori Makihara, Seiichi Miyazaki (Nagoya Univ.) SDM2017-26 |
[more] |
SDM2017-26 pp.25-29 |
SDM |
2017-06-20 15:15 |
Tokyo |
Campus Innovation Center Tokyo |
Capacitance Analyses of p-ch GaN MOS Structure on Polarization ― Junction Substrate Rumi Takayama, Takuya Hoshii (Tokyo Inst. of Tech.), Akira Nakajima (AIST), Shinichi Nishizawa (Kyushu Univ.), Hiromichi Ohashi, Kuniyuki Kakushima, Hitoshi Wakabayashi, Kazuo Tsutsui (Tokyo Inst. of Tech.) SDM2017-27 |
[more] |
SDM2017-27 pp.31-34 |
SDM |
2017-06-20 15:35 |
Tokyo |
Campus Innovation Center Tokyo |
Heavily-doped SOI Substrate and Transfer Printing for Fabrication of TMDC FETs Takamasa Kawanago, Ryo Ikoma, Hiroyuki Takagi, Shunri Oda (Tokyo Inst. of Tech.) SDM2017-28 |
[more] |
SDM2017-28 pp.35-38 |
SDM |
2017-06-20 16:10 |
Tokyo |
Campus Innovation Center Tokyo |
Low-Carrier-Density Sputtered-MoS2 Film by Vapor-Phase- Sulfurization Kentaro Matsuura, Takumi Ohashi, Iriya Muneta (Tokyo Tech), Seiya Ishihara (Meiji Univ.), Kuniyuki Kakushima, Kazuo Tsutsui (Tokyo Tech), Atsushi Ogura (Meiji Univ.), Hitoshi Wakabayashi (Tokyo Tech) |
[more] |
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SDM |
2017-06-20 16:30 |
Tokyo |
Campus Innovation Center Tokyo |
Characterization of defects in Ge1-xSnx gate stack structure Yuichi Kaneda, Shinnichi ike, Masayuki Kanematsu, Mitsuo Sakashita, Wakana Takeuchi, Osamu Nakatsuka, Shigeaki Zaima (Nagoya Univ.) SDM2017-29 |
(To be available after the conference date) [more] |
SDM2017-29 pp.39-42 |
SDM |
2017-06-20 16:50 |
Tokyo |
Campus Innovation Center Tokyo |
Formation of Ultrathin Crystalline Structure of Group-IV Elements on Epitaxial Ag(111) Surface Koichi Ito, Akio Ohta, Masashi Kurosawa, Masaaki Araidai, Mitsuhisa Ikeda, Katsunori Makihara, Seiichi Miyazaki (Nagoya Univ.) SDM2017-30 |
Two dimensional (2D) honeycomb crystals such as silicene and germanene are currently receiving much attention because of... [more] |
SDM2017-30 pp.43-48 |
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