IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

Technical Committee on Reliability (R)  (Searched in: 2020)

Search Results: Keywords 'from:2020-11-30 to:2020-11-30'
[Go to Official R Homepage (Japanese)] 
Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 7 of 7  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2020-11-30
13:00		 Online Online Ant Colony Optimization Algorithm Based on Birnbaum Importance and Necessary Condition for Optimal Arrangement Problems in a Linear Consecutive-k-out-of-n: F System
Issin Honma, Hisashi Yamamoto (Tokyo Metropolitan Univ.), Taishin Nakamura (Tokai Univ.) R2020-23		 In this study, we propose an ant colony optimization algorithm based on Birnbaum importance and necessary conditions for... [more] R2020-23
pp.1-6
R 2020-11-30
13:25		 Online Online On Software Safety Integrity Assessment for E/E/PE Safety-Related Systems
Shinji Inoue (Kansai Univ.), Takaji Fujiwara (SRATECH Lab. Inc.), Shigeru Yamada (Tottori Univ.) R2020-24		  [more] R2020-24
pp.7-12
R 2020-11-30
13:50		 Online Online R2020-25  [more] R2020-25
pp.13-16
R 2020-11-30
14:30		 Online Online Verification of effect by comparison of temperature cycle test and thermal shock test
Yuri Saito, Matsuguma Osamu, Aoki Yuichi (ESPEC) R2020-26		 (To be available after the conference date) [more] R2020-26
pp.17-20
R 2020-11-30
14:55		 Online Online Analysis for Degraded MLCC Using Voltage Contrast Method in SEM
Akira Saito (Murata) R2020-27		 To ensure the reliability of multi-layer ceramic capacitor (MLCC) while its miniaturization is accelerating, it is neces... [more] R2020-27
pp.21-24
R 2020-11-30
15:20		 Online Online Stochastic Modeling and Filtering for Reliability Predictions of Degradation Processes
Toru Kaise (Univ. of Hyogo) R2020-28		 Methodologies of reliability analysis using stochastic process models for degradation
data are proposed in many referen... [more]		 R2020-28
pp.25-29
R 2020-11-30
15:45		 Online Online A Study for Accelerated Humidity Stress Test (part 3)
Sadanori Itou (Itoken) R2020-29		 The humidity stress against electronics used in Japan cause the big influence for reliability. So, the humidity stress a... [more] R2020-29
pp.30-35
 Results 1 - 7 of 7  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan