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Technical Committee on Dependable Computing (DC) [schedule] [select]
Chair Nobuyasu Kanekawa (Hitachi)
Vice Chair Michiko Inoue (NAIST)
Secretary Koji Iwata (RTRI), Tatsuhiro Tsuthiya (Osaka Univ.)

Conference Date Fri, Feb 13, 2015 10:00 - 16:50
Topics VLSI Design and Test, etc 
Conference Place  
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reproduction
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Fri, Feb 13 AM 
10:00 - 11:15
(1) 10:00-10:25 Studies on FPGA Rejuvenation DC2014-78 Aromhack Saysanasongkham, Satoshi Fukumoto (Tokyo Metropolitan Univ.)
(2) 10:25-10:50 Study on Reliability Improvements of MLC PCM by Threshold Modification DC2014-79 Shinya Nakano, Masayuki Arai (Nihon Uni.v)
(3) 10:50-11:15 Note on Evaluation of Dependable Design Based on Approximate Logic DC2014-80 Haruki Saito, Masayuki Arai (Nihon Uni.v)
  11:15-11:30 Break ( 15 min. )
Fri, Feb 13 AM 
11:30 - 12:20
(4) 11:30-11:55 A Hardware Trojan Circuit Detection Method Based on Information of Nontransitional Lines DC2014-81 Tomohiro Bouyashiki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (KUS)
(5) 11:55-12:20 Test Method for Encryption LSI against Scan-based Attacks DC2014-82 Masayoshi Yoshimura (Kyoto Sangyo Univ.), Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.)
  12:20-13:45 Lunch Break ( 85 min. )
Fri, Feb 13 PM 
13:45 - 14:40
(6) 13:45-14:40 Report of International Test Conference DC2014-83 ITC Asian Committee (ITC Asian Comm)
  14:40-14:55 Break ( 15 min. )
Fri, Feb 13 PM 
14:55 - 15:45
(7) 14:55-15:20 A Method of Scheduling in High-Level Synthesis for Hierarchical Testability DC2014-84 Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.)
(8) 15:20-15:45 A Method of LFSR Seed Generation for Hierarchical BIST DC2014-85 Kosuke Sawaki, Satoshi Ohtake (Oita Univ.)
  15:45-16:00 Break ( 15 min. )
Fri, Feb 13 PM 
16:00 - 16:50
(9) 16:00-16:25 An Evalution of a Fault Diagnosis Method for Single Logical Faults Using Multi Cycle Capture Test Sets DC2014-86 Hideyuki Takano, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.)
(10) 16:25-16:50 A Simulated Annealing based Low IR Drop Pattern Selection Method for Resistive Open Fault Diagnosis DC2014-87 Senling Wang, Taiga Inoue, Hanan T.al-awadhi, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

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DC Technical Committee on Dependable Computing (DC)   [Latest Schedule]
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Last modified: 2014-12-24 17:18:15


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