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Technical Committee on Dependable Computing (DC) (Searched in: 2014)

Search Results: Keywords 'from:2015-02-13 to:2015-02-13'

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Search Results: Conference Papers

Conference Papers (Available on Advance Programs) (Sort by: Date Ascending)

Committee	Date Time	Place		Paper Title / Authors	Abstract	Paper #
DC	2015-02-13 10:00	Tokyo	Kikai-Shinko-Kaikan Bldg	Studies on FPGA Rejuvenation Aromhack Saysanasongkham, Satoshi Fukumoto (Tokyo Metropolitan Univ.) DC2014-78	In this paper, feasibility studies on implementing rejuvenation techniques on SRAM-based FPGAs are conducted. As a preli... [more]	DC2014-78 pp.1-6
DC	2015-02-13 10:25	Tokyo	Kikai-Shinko-Kaikan Bldg	Study on Reliability Improvements of MLC PCM by Threshold Modification Shinya Nakano, Masayuki Arai (Nihon Uni.v) DC2014-79	[more]	DC2014-79 pp.7-12
DC	2015-02-13 10:50	Tokyo	Kikai-Shinko-Kaikan Bldg	Note on Evaluation of Dependable Design Based on Approximate Logic Haruki Saito, Masayuki Arai (Nihon Uni.v) DC2014-80	[more]	DC2014-80 pp.13-18
DC	2015-02-13 11:30	Tokyo	Kikai-Shinko-Kaikan Bldg	A Hardware Trojan Circuit Detection Method Based on Information of Nontransitional Lines Tomohiro Bouyashiki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (KUS) DC2014-81	[more]	DC2014-81 pp.19-24
DC	2015-02-13 11:55	Tokyo	Kikai-Shinko-Kaikan Bldg	Test Method for Encryption LSI against Scan-based Attacks Masayoshi Yoshimura (Kyoto Sangyo Univ.), Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.) DC2014-82	[more]	DC2014-82 pp.25-30
DC	2015-02-13 13:45	Tokyo	Kikai-Shinko-Kaikan Bldg	Report of International Test Conference ITC Asian Committee (ITC Asian Comm) DC2014-83	[more]	DC2014-83 pp.31-36
DC	2015-02-13 14:55	Tokyo	Kikai-Shinko-Kaikan Bldg	A Method of Scheduling in High-Level Synthesis for Hierarchical Testability Jun Nishimaki, Toshinori Hosokawa (Nihon Univ.), Hideo Fujiwara (Osaka Gakuin Univ.) DC2014-84	We previously proposed a binding method for hierarchical testability to increase the number of hierarchically testable f... [more]	DC2014-84 pp.37-42
DC	2015-02-13 15:20	Tokyo	Kikai-Shinko-Kaikan Bldg	A Method of LFSR Seed Generation for Hierarchical BIST Kosuke Sawaki, Satoshi Ohtake (Oita Univ.) DC2014-85	A linear feedback shift register (LFSR) is used as a test pattern generator of built-in self-test (BIST). In BIST, alth... [more]	DC2014-85 pp.43-48
DC	2015-02-13 16:00	Tokyo	Kikai-Shinko-Kaikan Bldg	An Evalution of a Fault Diagnosis Method for Single Logical Faults Using Multi Cycle Capture Test Sets Hideyuki Takano, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) DC2014-86	Multi-cycle capture testing has been proposed to improve test quality of scan testing. However, fault diagnosis for mult... [more]	DC2014-86 pp.49-54
DC	2015-02-13 16:25	Tokyo	Kikai-Shinko-Kaikan Bldg	A Simulated Annealing based Low IR Drop Pattern Selection Method for Resistive Open Fault Diagnosis Senling Wang, Taiga Inoue, Hanan T.al-awadhi, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) DC2014-87	[more]	DC2014-87 pp.55-60

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