|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2022-07-14 13:35 |
Tokyo |
(Primary: On-site, Secondary: Online) |
3D modeling of USB Type-C connector and signal transmission analysis by FDTD Hayato Ide (NIT,Nagano College), Taiki Kitazawa, Youngwoo Kim, Yuitch Hayashi (NAIST), Takashi Kasuga (NIT,Nagano College) EMCJ2022-28 |
Purpose of this study is discussed about degradation of the signal transmission and influence of impedance variation on ... [more] |
EMCJ2022-28 pp.1-6 |
EMCJ |
2022-06-10 16:50 |
Hokkaido |
Hokkaido University (Primary: On-site, Secondary: Online) |
Fundamental Study of Electromagnetic Information Leakage Suppression at Printed Circuit Board Power Delivery Network in Cryptographic Devices Shinpei Wada, Daisuke Fujimoto, Yuichi Hayashi, Youngwoo Kim (NAIST) EMCJ2022-27 |
[more] |
EMCJ2022-27 pp.63-67 |
EMCJ |
2022-04-15 14:45 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Analysis of Crosstalk Suppression by Low-Impedance PDN Using Ultra-Thin and High Dielectric Permittivity Substrates Taiki Kitazawa, Youngwoo Kim, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2022-5 |
The high impedance power delivery network (PDN) induced crosstalk is caused by the return current discontinuity of signa... [more] |
EMCJ2022-5 pp.25-30 |
HWS, ICD [detail] |
2021-10-19 10:50 |
Online |
Online |
Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) HWS2021-43 ICD2021-17 |
A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave ... [more] |
HWS2021-43 ICD2021-17 pp.13-18 |
EMD |
2021-03-08 16:15 |
Online |
Online |
Fundamental Study on Effect of Surface Roughness of Contact Boundary and Torque Value on High-Frequency Characteristics of Connectors Hiroyuki Ueda, Shugo Kaji, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) EMD2020-37 |
Wear occurs on the contact surface due to sliding and vibration of the connector. This increases the contact resistance,... [more] |
EMD2020-37 pp.40-43 |
EMCJ |
2021-01-22 14:40 |
Online |
Online |
Construction of 3D Analysis Model due to Signal Transmission Evaluation in Connector Taiki Kitazawa (NIT,Nagano College), Hiroyuki Ueda, Fujimoto Daisuke, Youngwoo Kim, Hayashi Yuichi (NAIST), Kasuga Takashi (NIT,Nagano College) EMCJ2020-67 |
As high-speed transmission of big data progresses, Signal Integrity (SI) degradation and Electromagnetic Interference (E... [more] |
EMCJ2020-67 pp.18-23 |
EMD |
2020-12-04 15:25 |
Online |
Online |
Analysis of HDMI Mated Connector Electrical Performance Impacts on a Signal Integrity of the High-speed Digital System Kim Youngwoo (NAIST) EMD2020-23 |
[more] |
EMD2020-23 pp.30-33 |
EMD |
2020-12-04 15:50 |
Online |
Online |
Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto (NAIST), Taiki Kitazawa, Takashi Kasuga (NIT,Nagano College)), Yuichi Hayashi (NAIST) EMD2020-24 |
As the operating frequency of information devices increases, the noise generated by the device is also becoming broadban... [more] |
EMD2020-24 pp.34-38 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|