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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2020-02-26
Tokyo   A controller augmentation method to reduce the number of untestable faults for multiplexers with n-inputs
Yuki Takeuchi, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2019-90
With the complexity for VLSIs, transition fault testing is required. However, VLSIs generally have more untestable trans... [more] DC2019-90
DC 2019-02-27
Tokyo Kikai-Shinko-Kaikan Bldg. State Assignment Method to Improve Transition Fault Coverage for Datapath
Masayoshi Yoshimura (Kyoto Sangyo Univ.), Yuki Takeuchi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.) DC2018-78
Recently, it is indispensable to test in transition fault model due to timing defects increase along with complication a... [more] DC2018-78
DC 2018-02-20
Tokyo Kikai-Shinko-Kaikan Bldg. A Test Register Assignment Method for Operational Units to Reduce the Number of Test Patterns for Transition Faults Using Controller Augmentation
Yuki Takeuchi, Shun Takeda, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2017-78
It is required to reduce the number of test patterns to reduce test cost for VLSIs. Especially, design-for-testability m... [more] DC2017-78
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