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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
MW, ED |
2019-01-18 10:40 |
Tokyo |
Hitachi, Central Research Lab. |
The failure mode analysis on GaN-HEMT under High temperature operation Yasuyo Yotsuda (SEDI), Yasunori Tateno, Takumi Yonemura, Masato Furukawa, Hiroshi Yamamoto (SEI), Yukinori Nose, Satoshi Shimizu (SEDI) ED2018-81 MW2018-148 |
(To be available after the conference date) [more] |
ED2018-81 MW2018-148 pp.67-70 |
MW, ED |
2019-01-18 11:05 |
Tokyo |
Hitachi, Central Research Lab. |
Investigation of the Pulsed-IV Degradation Mechanism of GaN-HEMT under High Temperature Storage Tests Yasunori Tateno (Sumitomo Electric), Yasuyo Kurachi (Sumitomo Electric Device Innovations), Hiroshi Yamamoto, Takashi Nakabayashi (Sumitomo Electric) ED2018-82 MW2018-149 |
The purpose of this study is to investigate the physical mechanism of pulsed-IV degradation under high temperature stora... [more] |
ED2018-82 MW2018-149 pp.71-74 |
MW, ED |
2017-01-26 14:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
[Invited Lecture]
Commercialization of GaN-HEMT for High Frequency Application Yasunori Tateno (Sumitomo Electric) ED2016-97 MW2016-173 |
[more] |
ED2016-97 MW2016-173 pp.7-12 |
SDM, R, ED |
2007-11-16 15:45 |
Osaka |
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Leakage Current Screening for AlGaN/GaN HEMT Mass-Production Fumikazu Yamaki, Kazuaki Ishii, Masahiro Nishi, Hitoshi Haematsu, Yasunori Tateno, Haruo Kawata (EUD) R2007-52 ED2007-185 SDM2007-220 |
[more] |
R2007-52 ED2007-185 SDM2007-220 pp.33-37 |
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