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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2013-02-13
16:15		 Tokyo Kikai-Shinko-Kaikan Bldg. Temperature and voltage estimation considering manufacturing variability for a monitoring circuit
Yousuke Miyake, Wataru Tsumori, Yasuo Sato, Seiji Kajihara (Kyushu Inst. of Tech.), Yukiya Miura (Tokyo Metropolitan Univ.) DC2012-89		 Delay increase due to aging phenomena is a critical issue of VLSIs. For detecting such increase in field, a highly accur... [more] DC2012-89
pp.55-60
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2012-11-28
14:30		 Fukuoka Centennial Hall Kyushu University School of Medicine Design of temperature and voltage monitoring circuit structure for field test
Wataru Tsumori, Yousuke Miyake, Yasuo Sato, Seiji Kajihara (KIT), Yukiya Miura (TMU) VLD2012-101 DC2012-67		 For improving reliability of LSIs, the delay increase caused by aging during system operation should be detected before ... [more] VLD2012-101 DC2012-67
pp.243-248
DC 2012-06-22
16:35		 Tokyo Room B3-1 Kikai-Shinko-Kaikan Bldg Evaluation of the on-chip temperature and voltage using ring-oscillator-based monitoring circuit and a study for an application to field test
Yousuke Miyake, Takuma Sasakawa, Yasuo Sato, Seiji Kajihara (Kyutech), Yukiya Miura (TMU) DC2012-16		 Delay increase due to aging phenomena is a critical issue of VLSIs. For detecting such increase in field, highly accurat... [more] DC2012-16
pp.45-50
DC 2012-02-13
16:20		 Tokyo Kikai-Shinko-Kaikan Bldg. Evaluation of a thermal and voltage estimation circuit for field test
Yousuke Miyake, Yasuo Sato, Seiji Kajihara, Kohei Miyase (Kyutech), Yukiya Miura (TMU) DC2011-86		 High dependability is required for an embedded system VLSI. High functionality and high performance of VLSI, due to the ... [more] DC2011-86
pp.61-66
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