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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
MW 2009-11-19
14:30		 Kagoshima Tanegashima Two-Stage Reconfigurable Bandpass Filter using Two-Bit Variable-Length Transmission Line Resonator
Hiroki Mori, Jun-ichi Ohtsuka, Ryota Fukuda, Yasushi Yamao (The Univ of Electro-Comm.) MW2009-131		 Multiple frequency bands are used for present mobile communication systems. Current mobile terminals are installed with ... [more] MW2009-131
pp.19-23
ICD 2009-04-13
12:40		 Miyagi Daikanso (Matsushima, Miyagi) [Invited Talk] A 1.6GB/s DDR2 128Mb Chain FeRAM with Scalable Octal Bitline and Sensing Schemes
Hidehiro Shiga, Daisaburo Takashima, Shinichiro Shiratake, Katsuhiko Hoya, Tadashi Miyakawa, Ryu Ogiwara, Ryo Fukuda, Ryosuke Takizawa, Kosuke Hatsuda, Fumiyoshi Matsuoka, Yasushi Nagadomi, Daisuke Hashimoto, Hisaaki Nishimura, Takeshi Hioka, Sumiko Dohmae (Toshiba Corp.) ICD2009-1		 Ferroelectric RAMs (FeRAMs) are expected to be the next generation semiconductor memory for their fast access speed (com... [more] ICD2009-1
pp.1-6
RCS, SAT
(Joint)		 2008-12-18
11:25		 Tokyo Kikai-Shinko-Kaikan Bldg. Two-bit Variable Frequency Resonator using Transmission Line and RF switches
Jun-ichi Ohtsuka, Hiroki Mori, Ryo-ta Fukuda, Yasushi Yamao (The University of Electro-Communications) RCS2008-156		 Since multiple frequency bands are used for mobile communication systems, the current terminals are installed with multi... [more] RCS2008-156
pp.31-36
ICD 2007-04-13
09:10		 Oita   Floating Body RAM Technology and its Scalability to 32nm Node
Hiroomi Nakajima, Naoki Kusunoki, Tomoaki Shino (Toshiba), Tomoki Higashi (TOSMEC), Takashi Ohsawa, Katsuyuki Fujita, Nobuyuki Ikumi, Fumiyoshi Matsuoka, Ryo Fukuda, Yohji Watanabe, Yoshihiro Minami (Toshiba), Atsushi Sakamoto (TJ), Jun Nishimura, Takeshi Hamamoto, Akihiro Nitayama (Toshiba) ICD2007-10		 Technologies and improved performance of the Floating Body RAM are demonstrated. Reducing SOI thickness to 43nm, a 16Mb ... [more] ICD2007-10
pp.53-58
ICD 2005-04-15
11:30		 Fukuoka   Burst-Cycle Data Compression Schemes for Pre-Fuse Wafer-Level Test in Large Scale High-Speed embedded DRAM
Ryo Fukuda, Kenji Kobayashi (Toshiba Corp.), Masashi Akamatsu, Minoru Kaihatsu, Atsushi Tamura, Kazuo Taniguchi (Sony Corp.), Yohji Watanabe (Toshiba Corp.) 		This paper describes two novel data compression schemes suitable for high density and high speed embedded DRAMs. The par... [more] ICD2005-15
pp.13-17
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