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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
ICD, CPSY |
2015-12-18 09:25 |
Kyoto |
Kyoto Institute of Technology |
Substrate Noise Isolation Improvement by Helium-3 Ion Irradiation Technique in a Triple-well CMOS Process Ning Li (Tokyo Tech), Takeshi Inoue (S.H.I.Examination & Inspection), Takuichi Hirano, Jian Pang, Rui Wu, Kenichi Okada (Tokyo Tech), Hitoshi Sakane (S.H.I.Examination & Inspection), Akira Matsuzawa (Tokyo Tech) ICD2015-84 CPSY2015-97 |
[more] |
ICD2015-84 CPSY2015-97 pp.75-80 |
EMCJ, IEE-EMC, MW, EST [detail] |
2015-10-23 15:00 |
Miyagi |
Sakura Hall, Katahira Campus, Tohoku Univ. |
Design of Low Loss 60 GHz CMOS On-Chip Dipole Antenna By Helium-3 Ion Irradiation Takuichi Hirano, Ning Li, Kenichi Okada, Akira Matsuzawa, Jiro Hirokawa, Makoto Ando (Tokyo Tech.), Tsuyoshi Inoue, Hitoshi Sakane (SHIEI) EMCJ2015-79 MW2015-118 EST2015-89 |
60 GHz CMOS on-chip antenna is low radiation efficiency due to large loss of silicon (Si) substrate. In this paper, a 60... [more] |
EMCJ2015-79 MW2015-118 EST2015-89 pp.123-127 |
MWP, EMT, PN, LQE, OPE, EST, IEE-EMT [detail] |
2014-01-24 09:00 |
Kyoto |
Doshisha University |
Electromagnetic Simulation of High Resistance Silicon Substrate by Helium ion Irradiation Yuki Yao, Takuichi Hirano, Ning Li, Kenichi Okada, Akira Matsuzawa, Jiro Hirokawa, Makoto Ando (Tokyo Inst. of Tech.), Takeshi Inoue, Akinori Masaoka, Hitoshi Sakane (SEI) PN2013-61 OPE2013-175 LQE2013-161 EST2013-110 MWP2013-81 |
A helium(He)-3 ion bombardment technique has been proposed for creating locally high resistivity silicon substrate areas... [more] |
PN2013-61 OPE2013-175 LQE2013-161 EST2013-110 MWP2013-81 pp.181-185 |
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