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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
IN, NS (Joint) |
2023-03-02 14:00 |
Okinawa |
Okinawa Convention Centre + Online (Primary: On-site, Secondary: Online) |
A Routing Protocol Using Probabilistic Route Selection Based on Residual Capacity Ratio of Batteries for Wireless Sensor Networks Yuki Ofuchi, Shigetomo Kimura (Univ. of Tsukuba) IN2022-80 |
Corona-based wireless sensor networks form concentric clusters based on hop counts from the sink node. For the networks,... [more] |
IN2022-80 pp.85-90 |
MW, ED |
2017-01-27 13:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Study on dependence of passivation stress for electrical characteristics of AlGaN/GaN HEMTs by TCAD simulation Toshiyuki Oishi (Saga univ.), Yutaro Yamaguchi, Koji Yamanaka (Mitsubishi Electric corp.) ED2016-108 MW2016-184 |
Effects of passivation residual stress on electrical characteristics for GaN HEMTs have been studied by using a TCAD sim... [more] |
ED2016-108 MW2016-184 pp.63-68 |
LQE, ED, CPM |
2011-11-18 10:20 |
Kyoto |
Katsura Hall,Kyoto Univ. |
2D-mapping measurement of residual strain in GaN substrates by micro-reflectance spectroscopy Atsushi Yamaguchi (Kanazawa Inst. Tech.), H. Y. Geng, Haruo Sunakawa, Y. Ishihara, Toshiharu Matsueda, Akira Usui (Furukawa) ED2011-90 CPM2011-139 LQE2011-113 |
We have developed a novel method to precisely measure very small residual strains (~0.01%) in GaN substrates with micron... [more] |
ED2011-90 CPM2011-139 LQE2011-113 pp.87-91 |
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