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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
PRMU |
2016-10-21 11:10 |
Miyazaki |
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Photometric Stereo by SEM Image Utilizing Region Division Hiroki Matsuse, Gou Koutaki, Keiichi Uchimura (Kumamoto Univ.), Atsushi Miyamoto (Hitachi) PRMU2016-100 |
In this paper, we present a three-dimensional (3D) reconstruction method for semiconductor pattern using a scanning elec... [more] |
PRMU2016-100 pp.55-60 |
IBISML |
2012-03-13 15:05 |
Tokyo |
The Institute of Statistical Mathematics |
A Method for Packet Loss Rate Estimation Using Active and Passive Measurements Atsushi Miyamoto, Kazuho Watanabe, Kazushi Ikeda (NAIST) IBISML2011-104 |
It is an important problem for a network manager to understand characteristics of a network. A method for estimating an ... [more] |
IBISML2011-104 pp.117-121 |
NC |
2010-07-27 14:55 |
Kyoto |
Kyoto University |
Hierarchical Bayes method for NIRS-DOT inverse problem and its phase diagrams Atsushi Miyamoto, Kazuho Watanabe, Kazushi Ikeda (NAIST), Masa-aki Sato (ATR) NC2010-38 |
The NIRS-DOT is a method to reconstruct tomographic images from the data by solving the linear equations, which have amb... [more] |
NC2010-38 pp.51-56 |
NC, MBE (Joint) |
2010-03-10 14:10 |
Tokyo |
Tamagawa University |
Variational Bayes approach for NIRS-DOT inverse problem Atsushi Miyamoto, Kazuho Watanabe, Kazushi Ikeda (NAIST), Masa-aki Sato (ATR) NC2009-137 |
NIRS-DOT is tomography which is reconstructed from NIRS data. NIRS-DOT requires to solve the inverse problem which has i... [more] |
NC2009-137 pp.291-296 |
EA, US (Joint) |
2009-01-29 11:00 |
Kyoto |
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Nondestructive evaluation of a micro crack by a low power pulsed laser. Atsushi Miyamoto, Mami Matsukawa (Doshisha univ.) US2008-72 |
A simple measurement technique to evaluate micro cracks in a solid PMMA specimen is reported. Taking advantages of a two... [more] |
US2008-72 pp.1-6 |
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