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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2009-12-02 13:50 |
Kochi |
Kochi City Culture-Plaza |
[Invited Talk]
Failures due to Terrestriall Neutrons in Most Advanced Semicondutor Devices
-- Impacts and Hardening Techniques down to 22nm Design Rule -- Eishi Ibe, Kenichi Shimbo, Hitoshi Taniguchi, Tadanobu Toba (Hitachi, Ltd.) CPM2009-139 ICD2009-68 |
The status-of-the-art in failures and their mechanisms of CMOS memories and logic gates induced by terrestrial neutrons ... [more] |
CPM2009-139 ICD2009-68 pp.29-34 |
DC, CPSY |
2008-04-23 15:00 |
Tokyo |
Tokyo Univ. |
Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems Eishi Ibe (PERL) CPSY2008-7 DC2008-7 |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in
semicon... [more] |
CPSY2008-7 DC2008-7 pp.37-42 |
ICD |
2008-04-18 11:15 |
Tokyo |
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[Invited Talk]
Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
-- Evolution of Multi-Node Upset Issues -- Eishi Ibe (PERL) ICD2008-10 |
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicond... [more] |
ICD2008-10 pp.51-56 |
ICD, ITE-CE |
2006-12-15 10:15 |
Hiroshima |
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Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling Eishi Ibe (Hitachi), S. Chung, S. Wen (Cysco Systems), Hironaru Yamaguchi, Yasuo Yahagi (Hitachi), hideaki Kameyama, Shigehisa Yamamoto, Takashi Akioka (Renesas) |
[more] |
ICD2006-161 pp.103-108 |
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