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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 11 of 11  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2023-03-10
13:50		 Hiroshima
(Primary: On-site, Secondary: Online)		 Failure Sign Detection by State Path Analysis for Fare Collection System -- Evaluation by Sequential Pattern Mining with Mechatronics Knowledge --
Ken Ueno, Misato Ishikawa, Yuko Kobayashi, Takamitsu Sunaoshi (Toshiba), Kiyoku Endo (Toshiba Automation Systems Service) R2022-50		 To detect failure sign on Fare Collection System (FCS) which has low failure rate accurately, we need the mechatronics k... [more] R2022-50
pp.13-18
IBISML 2011-03-28
10:00		 Osaka Nakanoshima Center, Osaka Univ. Infinite Hidden Markov Random Field Model and Its Application to Semiconductor Manufacturing Data
Ryusei Shingaki, Ken Ueno, Shizu Sakakibara (Toshiba Corp.) IBISML2010-104		 (Advance abstract in Japanese is available) [more] IBISML2010-104
pp.1-7
ICD 2009-12-14
13:30		 Shizuoka Shizuoka University (Hamamatsu) [Poster Presentation] A nanowatt DA converter for subthreshold CMOS LSIs
Kazuki Yamamoto, Ken Ueno, Tetsuya Asai, Yoshihito Amemiya (Hokkaido Univ.) ICD2009-88		 An ultra-low power digital-to-analog (DA) converter based on the technique of pulse-width-modulated DA conversion was pr... [more] ICD2009-88
pp.59-64
ICD 2009-12-14
13:30		 Shizuoka Shizuoka University (Hamamatsu) [Poster Presentation] Intermittent Pulse Generator for Ultra-Low Power LSIs
Hiromichi Matsushita, Ken Ueno, Tetsuya Asai, Yoshihito Amemiya (Hokkaido Univ.) ICD2009-89		 We proposed a timer circuit for the intermittent operation of ultra-lowpower LSIs. The circuit consists of a clock oscil... [more] ICD2009-89
pp.65-70
ICD, ITE-IST 2009-10-02
17:25		 Tokyo CIC Tokyo (Tamachi) A fully-integrated clock reference generator with frequency-locked loop
Ken Ueno, Tetsuya Asai, Yoshihito Amemiya (Hokkaido Univ.) ICD2009-61		 A temperature- and supply-independent clock generator has been developed using 0.35-um CMOS technology. This generator i... [more] ICD2009-61
pp.159-164
ICD, ITE-IST 2008-10-22
17:05		 Hokkaido Hokkaido University Process and compensation techniques for low-voltage CMOS digital circuits
Yusuke Tsugita, Ken Ueno (Hokudai Univ), Tetsuya Hirose (Koube Univ), Tetsuya Asai, Yoshihito Amemiya (Hokudai Univ) ICD2008-67		 In low-voltage CMOS digital circuits, threshold voltage varaition fluctuates circuit performance significantly. In this ... [more] ICD2008-67
pp.49-54
ICD, ITE-IST 2008-10-22
17:30		 Hokkaido Hokkaido University An Ultra-low Power Voltage Reference consisting of Subthreshold MOSFETs
Ken Ueno (Hokkaido Univ.), Tetsuya Hirose (Kobe Univ.), Tetsuya Asai, Yoshihito Amemiya (Hokkaido Univ.) ICD2008-68		 An ultra-low power CMOS voltage reference circuit has been fabricated in
0.35-um standard CMOS process. The circuit ge... [more]		 ICD2008-68
pp.55-60
KBSE 2008-03-10
15:00		 Tokyo Kikai-Shinko-Kaikan Bldg. B3F-2 Reconstructing Attribute Dependencies and its Interpretation in Classification Problems -- Experimental Results on Modeling Probabilistic Dependencies with Bayesian Network Classifiers --
Ken Ueno, Youichi Kitahara, Paul Topon Kumar, Ryohei Orihara (Toshiba Co.) KBSE2007-59		 Recently, many researchers have been focusing on Bayesian Network Classifiers (BNC) as classifiers which can consider de... [more] KBSE2007-59
pp.31-36
ICD, ITE-IST 2007-07-26
08:55		 Hyogo   CMOS voltage reference based on threshold voltage of a MOSFET
Ken Ueno, Tetsuya Hirose, Tetsuya Asai, Yoshihito Amemiya (Hokkaido Univ.) ICD2007-38		 We developed a voltage reference circuit using MOSFETs operated in the subthreshold region, except for the MOS resistor ... [more] ICD2007-38
pp.5-10
ICD, SDM 2006-08-17
11:20		 Hokkaido Hokkaido University A CMOS Monitoring Sensor for Guaranteeing the Quality of Various Perishables with a Wide Range of Activation Energy
Ken Ueno, Tetsuya Hirose, Tetsuya Asai, Yoshihito Amemiya (Hokkaido Univ.) 		 [more] SDM2006-130 ICD2006-84
pp.31-36
ICD, ITE-IST 2006-07-28
11:30		 Shizuoka   A smart temperature sensor LSI using subthreshold MOSFET
Ken Ueno, Tetsuya Hirose, Tetsuya Asai, Yoshihito Amemiya (Hokkaido Univ.) 		 [more] ICD2006-71
pp.61-65
 Results 1 - 11 of 11  /   
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