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Committee
Date Time
Place
Paper Title / Authors
Abstract
Paper #
SDM
,
ED
(Workshop)
2012-06-29
12:00
Okinawa
Okinawa Seinen-kaikan
Reliability Measurement of PFETs under Post Fabrication Self-Improvement Scheme for SRAM
Nurul Ezaila Alias
,
Anil Kumar
,
Takuya Saraya
(
Univ. of Tokyo
),
Shinji Miyano
(
STARC
),
Toshiro Hiramoto
(
Univ. of Tokyo
)
The negative bias temperature instability (NBTI) reliability of PFETs is measured under the post fabrication SRAM self-i...
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