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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2011-02-14 11:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Variation Aware Test Methodology Based on Statistical Static Timing Analysis Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo (STARC)  DC2010-62 |
The continuing miniaturization of LSI dimension may cause parametric faults which exceed the specification due to proces... [more] | DC2010-62 pp.21-26 |
| DC | 2009-06-19 11:35 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Diagnositc Test Generation for Transition Faults Using a Stuck-at ATPG Tool Yoshinobu Higami, Yosuke Kurose, Satoshi Ohno, Hironori Yamaoka, Hiroshi Takahashi (Ehime Univ.), Yoshihiro Simizu, Takashi Aikyo (STARC), Yuzo Takamatsu (Ehime Univ.) DC2009-13 |
In modern high-speed LSIs, defects that cause timing failure occur often, and thus their detection and diagnosis are get... [more] | DC2009-13 pp.19-24 |
| DC | 2009-06-19 14:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Power & Noise Aware Test Utilizing Preliminary Estimation Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo (STARC) DC2009-15 |
Advances in low power design technologies is making issues on power dissipation and IR-drop in testing more serious. Exc... [more] | DC2009-15 pp.29-30 |
| DC | 2009-02-16 13:50 |
Tokyo | A method for generating defect oriented test patterns for combinational circuits Hiroshi Takahashi, Yoshinobu Higami, Taisuke Izumi, Takashi Aikyo, Yuzo Takamatsu (Ehime Univ.) DC2008-73 |
With shrinking of LSIs, the diversification of defective mode due to defects becomes a critical issue. Therefore, the ... [more] |
DC2008-73 pp.31-36 |
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| DC | 2009-02-16 14:40 |
Tokyo | Note on Small Delay Fault Model for Intra-Gate Resistive Open Defects Masayuki Arai, Akifumi Suto, Kazuhiko Iwasaki (Tokyo Metro. Univ.), Katsuyuki Nakano, Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo (STARC) DC2008-75 |
[more] | DC2008-75 pp.43-48 |
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| DC | 2008-06-20 15:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg | Improving the Diagnostic Quality of Open Faults Koji Yamazaki, Toshiyuki Tsutsumi (Meiji Univ.), Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo (Ehime Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.), Yuzo Takamatsu (Ehime Univ.) DC2008-16 |
With the shrinking process technologies and the use of copper process, open defects on interconnect wires, contacts and ... [more] | DC2008-16 pp.29-34 |
| DC | 2008-02-08 09:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Fault Diagnosis for Dyinamic Open Faults with Considering Adjacent Lines Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Syuhei Kadoyama, Tetsuya Watanabe, Yuzo Takamatsu (Ehime Univ.), Toshiyuki Tsutsumi, Kouji Yamazaki (Meiji Univ.), Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) DC2007-68 |
In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal interconne... [more] | DC2007-68 pp.7-12 |
| DC | 2008-02-08 09:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Diagnostic Test Generation for Transition Faults Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Toru Kikkawa, Yuzo Takamatsu (Ehime Univ.) DC2007-69 |
In modern manufacturing technologies with the shrinking of manufacturing process, LSIs may have several metal intercon... [more] |
DC2007-69 pp.13-18 |
| ICD, CPM | 2007-01-19 13:25 |
Tokyo | Kika-Shinko-Kaikan Bldg. | A Note on 100x Test Data Compression for Scan-Based BIST Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki (Tokyo Metro. Univ.), Tatsuru Matsuo, Takahisa Hiraide (Fujitsu Lab.), Hideaki Konishi, Michiaki Emori, Takashi Aikyo (Fujitsu) |
[more] | CPM2006-149 ICD2006-191 pp.115-120 |
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