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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DE, IPSJ-DBS, IPSJ-IFAT [detail] | 2023-09-22 10:55 |
Fukuoka | Kitakyushu International Conference Center | Probing the ability to accurately understand and utilize the ordinal numbers by transformer model Kanji Hayashi, Hisashi Miyamori (Kyoto Sangyou Univ.)  DE2023-21 |
[more] | DE2023-21 pp.60-65 |
| CPSY, DC, IPSJ-ARC [detail] | 2023-08-03 11:20 |
Hokkaido | Hakodate Arena (Primary: On-site, Secondary: Online) |
A Don't Care Filling Method of Control Signals in Controllers to Maximize the Number of Distinguishable Weighted Hardware Element Pairs Yui Otsuka, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Koji Yamazaki (Meiji Univ.) CPSY2023-12 DC2023-12 |
[more] | CPSY2023-12 DC2023-12 pp.25-30 |
| HWS, VLD | 2023-03-03 11:50 |
Okinawa | (Primary: On-site, Secondary: Online) |
A Seed Selection Method to Minimize Test Application Time for Logic BIST Using Pseudo Boolean Optimization Rei Miura, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.) VLD2022-105 HWS2022-76 |
[more] | VLD2022-105 HWS2022-76 pp.173-178 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2022-11-29 10:05 |
Kumamoto | (Primary: On-site, Secondary: Online) |
A Seed Generation Method for Multiple Random Pattern Resistant Stuck-at Faults in Built-In Self-Test Rei Miura, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.) VLD2022-27 ICD2022-44 DC2022-43 RECONF2022-50 |
[more] | VLD2022-27 ICD2022-44 DC2022-43 RECONF2022-50 pp.49-54 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-07-27 10:15 |
Yamaguchi | Kaikyo Messe Shimonoseki (Primary: On-site, Secondary: Online) |
On the Acceleration of a Low Power Oriented Test Generation Method Using Fault Excitation Conditions Rei Miura, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) CPSY2022-2 DC2022-2 |
[more] | CPSY2022-2 DC2022-2 pp.7-12 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-07-27 11:00 |
Yamaguchi | Kaikyo Messe Shimonoseki (Primary: On-site, Secondary: Online) |
A Block Partitioning Method to Accelerate Test Generation for Gate-Exhaustive Faults Momona Mizota, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.) CPSY2022-3 DC2022-3 |
In gate-exhaustive fault model which covers defects in cells, since the number of faults is proportion to that of gates,... [more] | CPSY2022-3 DC2022-3 pp.13-18 |
| DC | 2021-12-10 13:00 |
Kagawa | (Primary: On-site, Secondary: Online) |
A Low Power Oriented Multiple Target Test Generation Method Rei Miura, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) DC2021-55 |
In recent years, since capture power consumption for VLSIs significantly increases in at-speed scan testing, low capture... [more] | DC2021-55 pp.1-6 |
| HWS, VLD | 2019-03-01 12:40 |
Okinawa | Okinawa Ken Seinen Kaikan | On evaluation of an efficient SAT attack algorithm for logic encryption Yusuke Matsunaga (Kyushu Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.) VLD2018-126 HWS2018-89 |
[more] | VLD2018-126 HWS2018-89 pp.199-204 |
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