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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
KBSE, SS, IPSJ-SE [detail] |
2024-07-27 09:45 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
Rio Kishimoto (Osaka Univ.), Tetsuya Kanda (Notre Dame Seishin Univ.), Yuki Manabe (The Univ. of Fukuchiyama), Katsuro Inoue (Nanzan Univ.), Yoshiki Higo (Osaka Univ.) |
[more] |
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SS |
2024-03-08 13:55 |
Okinawa |
(Primary: On-site, Secondary: Online) |
Analysis of Stack Overflow Questions on the Use of SBOM Wataru Otoda, Tetsuya Kanda (Osaka Univ.), Yuki Manabe (The Univ. of Fukuchiyama), Katsuro Inoue (Nanzan Univ.), Yoshiki Higo (Osaka Univ.) SS2023-70 |
(To be available after the conference date) [more] |
SS2023-70 pp.127-132 |
SS, KBSE, IPSJ-SE [detail] |
2023-07-21 11:00 |
Hokkaido |
(Primary: On-site, Secondary: Online) |
A tool for vulnerability assessment and checksum verification using SPDX documents Rio Kishimoto, Tetsuya Kanda (Osaka Univ.), Yuki Manabe (The Univ. of Fukuchiyama), Katsuro Inoue (Nanzan Univ.), Yoshiki Higo (Osaka Univ.) SS2023-8 KBSE2023-19 |
Libraries are widely used in recent software development, but their management is insufficient, and there are problems s... [more] |
SS2023-8 KBSE2023-19 pp.43-48 |
EMCJ, MW, EST, IEE-EMC [detail] |
2022-10-14 09:50 |
Akita |
Akita University (Primary: On-site, Secondary: Online) |
Development of an Evaluation System for Modeling of Information Leakage Induced by Low-Power IEMI Seiya Takano, Shugo Kaji (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2022-53 MW2022-99 EST2022-63 |
The threats of electromagnetic (EM) information leakage induced by low-power intentional EM interference have been repor... [more] |
EMCJ2022-53 MW2022-99 EST2022-63 pp.93-96 |
ICD, HWS [detail] |
2020-10-26 09:50 |
Online |
Online |
Fundamental Evaluation Method of EM Information Leakage Caused by Intentional Electromagnetic Interference
-- Impact of Impedance Change in Digital Output Circuits -- Shugo Kaji, Daisuke Fujimoto (NAIST), Masahiro Kinugawa (Univ. of Fukuchiyama), Yuichi Hayashi (NAIST) HWS2020-27 ICD2020-16 |
New threats have been shown to cause information leakage by irradiating electromagnetic (EM) waves of specific intensity... [more] |
HWS2020-27 ICD2020-16 pp.13-17 |
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