|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ, IEE-EMC, IEE-SPC |
2022-12-07 16:15 |
Aichi |
|
Construction of electromagnetic wave shielding effect measurement method using loop antenna Kosuke Yuasa, Akihiko Saito, Hiroyuki Takabayashi (Daido Steel), Atsuhiro Nishikata (Tokyo Tech) EMCJ2022-71 |
[more] |
EMCJ2022-71 pp.44-48 |
CPM, ED, SDM |
2008-05-16 13:15 |
Aichi |
Nagoya Institute of Technology |
Effect of strain relaxation process on polarization in strained superlattice spin-polarized photocathode Yuya Maeda, Jin Xiuguang, Masatoshi Tanioku, Shingo Fuchi, Toru Ujihara, Yoshikazu Takeda, Naoto Yamamoto, Atsushi Mano, Yasuhide Nakagawa, Masahiro Yamamoto, Shoji Okumi, Nakanishi Tsutomu (Nagoya Univ.), Takashi Saka (Daido institute of Technology), Horinaka Hiromiti (Osaka Prefecture Univ.), Toshihiro Kato (Daido Steel Co. Ltd) ED2008-16 CPM2008-24 SDM2008-36 |
We successfully developed a super-high brightness and high-spin-polarization electron source based on GaAs/GaAsP strain ... [more] |
ED2008-16 CPM2008-24 SDM2008-36 pp.75-80 |
EMCJ |
2005-05-26 09:05 |
Hyogo |
Awaji Yumebutai International Conference Center |
Quantitative study for measurement error caused by curvature of a reference plate in free space method Takahiro Aoyagi, Atsuhiro Nishikata (Tokyo Tech), Akihiko Saito (Daido steel Co. Ltd.) |
(To be available after the conference date) [more] |
EMCJ2005-10 pp.1-6 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|