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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2016-04-14
14:15		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] ReRAM reliability characterization and improvement by machine learning
Tomoko Ogura Iwasaki, Sheyang Ning, Hiroki Yamazawa, Chao Sun, Shuhei Tanakamaru, Ken Takeuchi (Chuo Univ.) ICD2016-8		 The low voltage and fast program capability of ReRAM is very attractive for next-generation memory applications, but the... [more] ICD2016-8
pp.39-44
ICD 2016-04-15
09:30		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] Faster LBA scrambler utilized SSD with Garbage Collection Optimization
Chihiro Matsui, Asuka Arakawa, Chao Sun, Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.) ICD2016-13		 (To be available after the conference date) [more] ICD2016-13
pp.65-69
ICD 2016-04-15
09:55		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] Design of SCM/NAND Flash Hybrid SSD System for Each Data Access Pattern
Tomoaki Yamada, Shun Okamoto, Chao Sun, Shogo Hachiya, Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.) ICD2016-14		  [more] ICD2016-14
pp.71-76
ICD 2016-04-15
10:20		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Lecture] Highly Reliable Method for Long-Term Semiconductor Data Storage
Tomonori Takahashi, Senju Yamazaki, Shuhei Tanakamaru, Tomoko Ogura Iwasaki, Shogo Hachiya, Ken Takeuchi (Chuo Univ.) 		 [more]
ICD, CPSY 2015-12-17
16:00		 Kyoto Kyoto Institute of Technology [Poster Presentation] Reliability evaluation of the non-volatile memory device using carbon nanotubes
Takashi Inose, Tomoko Ogura Iwasaki, Sheyang Ning, Ken Takeuchi (Chuo Univ.) ICD2015-73 CPSY2015-86		  [more] ICD2015-73 CPSY2015-86
p.45
ICD, CPSY 2015-12-17
16:00		 Kyoto Kyoto Institute of Technology [Poster Presentation] Error Tendency Analysis in NAND Flash Memory
Yoshio Nakamura, Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.) ICD2015-76 CPSY2015-89		 Program-disturb and data-retention degrade the reliability of NAND flash memory. During program-disturb, VTH of the memo... [more] ICD2015-76 CPSY2015-89
p.51
ICD 2014-01-28
15:00		 Kyoto Kyoto Univ. Tokeidai Kinenkan [Poster Presentation] Control of ReRAM resistance
Tatsuya Fujii, Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ) ICD2013-128		 ReRAM is being developed and considered as a next-generation non-volatile memory. It shows excellent performances such a... [more] ICD2013-128
p.65
ICD 2012-12-17
15:55		 Tokyo Tokyo Tech Front [Poster Presentation] 3x Write and 5x Read Speed Increase for RRAM with Disturb Free Bipolar Operation
Sheyang Ning (Chuo Univ./Univ. of Tokyo), Tomoko Ogura Iwasaki, Ken Takeuchi (Chuo Univ.) ICD2012-99		 The RRAM high speed operation is handicapped by the need to verify during set/reset, and the limited read voltage for re... [more] ICD2012-99
p.43
 Results 1 - 8 of 8  /   
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