IEICE Technical Committee Submission System
Conference Schedule		 Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
HWS, VLD 2023-03-02
13:25		 Okinawa
(Primary: On-site, Secondary: Online)		 [Memorial Lecture] Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects
Takuma Nagao (NAIST), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (Sony Semiconductor Manufacturing), Michiko Inoue (NAIST), Michihiro Shintani (Kyoto Institute of Technology) VLD2022-91 HWS2022-62		 Statistical wafer-level variation modeling is an attractive method for reducing the measurement cost in large-scale inte... [more] VLD2022-91 HWS2022-62
p.109
OPE, OCS, LQE 2022-10-20
15:45		 Ehime
(Primary: On-site, Secondary: Online)		 Theoretical and Experimental Investigation of Frequency Chirp Induced by Inter-Arm Imbalance in Mach-Zehnder Silicon Optical Modulators
Tadashi Murao, Jun Ushida, Hiroyuki Takahashi, Masatoshi Tokushima, Akemi Shiina, Tsuyoshi Horikawa (PETRA) OCS2022-22 OPE2022-68 LQE2022-31		 Characteristic variations caused by nonuniformities in the fabrication process are inevitable in carrier-depletion Mach–... [more] OCS2022-22 OPE2022-68 LQE2022-31
pp.28-33
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]		 2021-12-02
14:20		 Online Online Wafer-level Variation Modeling for Multi-site Testing of RF Circuits
Riaz-ul-haque Mian (Shimane Univ.), Michihiro Shintani (NAIST) VLD2021-42 ICD2021-52 DC2021-48 RECONF2021-50		 Wafer-level performance prediction has been attracting attention to reduce measurement costs without compromising test q... [more] VLD2021-42 ICD2021-52 DC2021-48 RECONF2021-50
pp.144-149
OCS, OPE, LQE 2021-10-22
16:30		 Online Online Compact Model and Parametric Extraction for Optical Phase Shifters in Carrier-Depletion Mach-Zehnder Silicon Modulators
Tadashi Murao, Jun Ushida, Hiroyuki Takahashi, Masatoshi Tokushima, Akemi Shiina, Tsuyoshi Horikawa (PETRA) OCS2021-18 OPE2021-38 LQE2021-17		 Testing processes in silicon photonics are totally different from electronics and reduction of testing time has been an ... [more] OCS2021-18 OPE2021-38 LQE2021-17
pp.27-32
OCS, OPE, LQE 2021-10-22
16:55		 Online Online Theoretical and Experimental Investigation of OMA Penalty by Inter-Arm Imbalance in Mach-Zehnder Silicon Optical Modulators
Tadashi Murao, Jun Ushida, Hiroyuki Takahashi, Masatoshi Tokushima, Akemi Shiina, Tsuyoshi Horikawa (PETRA) OCS2021-19 OPE2021-39 LQE2021-18		 In this paper, an inter-arm imbalance and its impact on the optical modulation amplitude (OMA) are investigated for carr... [more] OCS2021-19 OPE2021-39 LQE2021-18
pp.33-38
 Results 1 - 5 of 5  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan