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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
HWS, VLD |
2023-03-02 13:25 |
Okinawa |
(Primary: On-site, Secondary: Online) |
[Memorial Lecture]
Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects Takuma Nagao (NAIST), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (Sony Semiconductor Manufacturing), Michiko Inoue (NAIST), Michihiro Shintani (Kyoto Institute of Technology) VLD2022-91 HWS2022-62 |
Statistical wafer-level variation modeling is an attractive method for reducing the measurement cost in large-scale inte... [more] |
VLD2022-91 HWS2022-62 p.109 |
OPE, OCS, LQE |
2022-10-20 15:45 |
Ehime |
(Primary: On-site, Secondary: Online) |
Theoretical and Experimental Investigation of Frequency Chirp Induced by Inter-Arm Imbalance in Mach-Zehnder Silicon Optical Modulators Tadashi Murao, Jun Ushida, Hiroyuki Takahashi, Masatoshi Tokushima, Akemi Shiina, Tsuyoshi Horikawa (PETRA) OCS2022-22 OPE2022-68 LQE2022-31 |
Characteristic variations caused by nonuniformities in the fabrication process are inevitable in carrier-depletion Mach–... [more] |
OCS2022-22 OPE2022-68 LQE2022-31 pp.28-33 |
VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2021-12-02 14:20 |
Online |
Online |
Wafer-level Variation Modeling for Multi-site Testing of RF Circuits Riaz-ul-haque Mian (Shimane Univ.), Michihiro Shintani (NAIST) VLD2021-42 ICD2021-52 DC2021-48 RECONF2021-50 |
Wafer-level performance prediction has been attracting attention to reduce measurement costs without compromising test q... [more] |
VLD2021-42 ICD2021-52 DC2021-48 RECONF2021-50 pp.144-149 |
OCS, OPE, LQE |
2021-10-22 16:30 |
Online |
Online |
Compact Model and Parametric Extraction for Optical Phase Shifters in Carrier-Depletion Mach-Zehnder Silicon Modulators Tadashi Murao, Jun Ushida, Hiroyuki Takahashi, Masatoshi Tokushima, Akemi Shiina, Tsuyoshi Horikawa (PETRA) OCS2021-18 OPE2021-38 LQE2021-17 |
Testing processes in silicon photonics are totally different from electronics and reduction of testing time has been an ... [more] |
OCS2021-18 OPE2021-38 LQE2021-17 pp.27-32 |
OCS, OPE, LQE |
2021-10-22 16:55 |
Online |
Online |
Theoretical and Experimental Investigation of OMA Penalty by Inter-Arm Imbalance in Mach-Zehnder Silicon Optical Modulators Tadashi Murao, Jun Ushida, Hiroyuki Takahashi, Masatoshi Tokushima, Akemi Shiina, Tsuyoshi Horikawa (PETRA) OCS2021-19 OPE2021-39 LQE2021-18 |
In this paper, an inter-arm imbalance and its impact on the optical modulation amplitude (OMA) are investigated for carr... [more] |
OCS2021-19 OPE2021-39 LQE2021-18 pp.33-38 |
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