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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| R | 2015-11-19 14:25 |
Osaka | A Measurement Method for the Extent of Simultaneous Soft Errors Noboru Masuda, Moritoshi Yasunaga (Univ. of Tsukuba)  R2015-57 |
Regarding the LSI soft error caused by the neutron beam, a single particle of neutron may cause multiple chained soft er... [more] | R2015-57 pp.5-10 |
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| ICD | 2013-04-12 16:20 |
Ibaraki | Advanced Industrial Science and Technology (AIST) | NMOS-Inside 6T SRAM Layout Reducing Neutron-Induced Multiple Cell Upsets Shusuke Yoshimoto, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto (Kobe Univ.) ICD2013-23 |
This paper presents a proposed NMOS-centered 6T SRAM cell layout that reduces a neutron-induced multiple-cell-upset (MCU... [more] | ICD2013-23 pp.121-126 |
| ICD | 2012-12-18 11:45 |
Tokyo | Tokyo Tech Front | A 65 nm Low-Power Adaptive-Coupling Redundant Flip-Flop Masaki Masuda, Kanto Kubota, Ryosuke Yamamoto (KIT), Jun Furuta (Kyoto Univ.), Kazutoshi Kobayashi (KIT), Hidetoshi Onodera (Kyoto Univ.) ICD2012-117 |
We propose a low-power redundant flip-flop to be operated with high reliability over 1 GHz clock frequency based on the ... [more] | ICD2012-117 pp.109-113 |
| ICD | 2011-12-16 14:50 |
Osaka | Multiple-Bit-Upset and Single-Bit-Upset Resilient 8T SRAM Bitcell Layout with Divided Wordline Structure Yohei Umeki, Shusuke Yoshimoto, Takurou Amashita, Hiroshi Kawaguchi (Kobe Univ.), Masahiko Yoshimoto (Kobe Univ./JST) ICD2011-134 |
This paper presents a new 8T (8-transistor) SRAM cell layout mitigating multiple-bit upset (MBU) in a divided wordline s... [more] | ICD2011-134 pp.161-166 |
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| SDM | 2010-11-12 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Modeling of Single-Event-Transient Pulse Generation in Inverter Cells Katsuhiko Tanaka, Hideyuki Nakamura, Taiki Uemura, Kan Takeuchi, Toshikazu Fukuda, Shigetaka Kumashiro, Tohru Mogami (MIRAI-Selete) SDM2010-180 |
Soft errors in logic circuits due to the propagation of erroneous signal caused by ionized particle generated by cosmic ... [more] | SDM2010-180 pp.47-52 |
| ITE-MMS, ITE-CE, MRIS | 2009-01-15 13:30 |
Osaka | Development of Fe16N2 Ultra Fine Particles for High Density Recording Media Yuji Sasaki, Tetsutaro Inoue, Toshiyuki Watanabe, Tsugihiro Doi, Mikio Kishimoto (Hitachi Maxell, Ltd.), Takayuki Oku, Kazuhisa Kakurai (Japan Atomic Enerht Agency) MR2008-51 |
For high density recording media, Fe16N2 fine particles were developed using co-precipitation and nitridation treatment ... [more] | MR2008-51 pp.5-9 |
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| ICD | 2005-04-15 14:00 |
Fukuoka | Analysys of SRAM neutron-Induced Errors Based on the Consideration of Both Charge-Collection and Parasitic-BipolarFailure Modes Kenichi Osada (Hitachi), Naoki Kitai (Hitachi ULSI), Shiro Kamohara (Renesas), Takayuki Kawahara (Hitachi) |
This paper describes an investigation of the upsetting of values in cells hit by alpha particles or neutrons, in which t... [more] | ICD2005-18 pp.31-36 |
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