Print edition: ISSN 0913-5685
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OME2006-50
Control of Field Effect Transistor Characteristics using P3HT Cast Film
Keita Nagai, Hiroshi Yamauchi, Masaaki Iizuka, Kazuhiro Kudo (Chiba Univ.)
pp. 1 - 4
OME2006-51
Preparation of Chiral Polyacetylene films from achiral monomer and their optical and electrical properties
Hideki Kohn, Yuki Ohshima, Zou Gang, Takaaki Manaka, Mitsumasa Iwamoto (Tokyo Tech)
pp. 5 - 9
OME2006-52
Ambipolar FET characteristics of (d8-BEDT-TTF)(TCNQ) complex
Takeshi Endoh, Hirotaka Sakuma, Masatoshi Sakai, Masakazu Nakamura, Kazuhiro Kudo (Chiba Univ.)
pp. 11 - 15
OME2006-53
Spray-jet technique for studying non-volatile molecules
-- Apparatus-development and improvement --
Toshiki Yamada, Hitoshi Suzuki, Toshiya Kamikado, Shinro Mashiko, Shiyoshi Yokoyama (NICT)
pp. 17 - 21
OME2006-54
Effect of local Joule heat on FET characteristics of organic nano transistor
Haruya Miyata, Kohei Itami, Masatoshi Sakai, Masaaki Iizuka, Masakazu Nakamura, Kazuhiro Kudo (Chiba Unv.)
pp. 23 - 26
OME2006-55
Fabrication of Organic Single-Electron Transistors
Yutaka Noguchi, Tohru Kubota, Toshiya Kamikado, Rieko Ueda, Shinro Mashiko (NICT)
pp. 27 - 31
OME2006-56
Low voltage operation of organic CMOS inverter circuit with double-gate structure
Kazuki Hizu, Tsuyoshi Sekitani (Univ. Tokyo), Youko Shimada, Joe Otsuki (Nihon Univ.), Makoto Takamiya, Takayasu Sakurai, Takao Someya (Univ. Tokyo)
pp. 33 - 35
OME2006-57
Applications of effective isolation of functional molecules using cone-shaped dendron molecules
Akira Otomo, Hideki Miki, Isao Aoki, Yukito Naitoh, Shiyoshi Yokoyama (NICT)
pp. 37 - 40
OME2006-58
Evaluation of organic device using the infrared absorption spectroscopy in the multiple internal reflection geometry
Gakuji Yamamoto, Satoshi Ogawa, Yasuo Kimura (Tohoku Univ. RIEC), Hisao Ishii (Chiba Univ.), Michio Niwano (Tohoku Univ. RIEC)
pp. 41 - 46
OME2006-59
Bias dependence on high-speed response organic photodetector
Taichiro Morimune, Hirotake Kajii, Yutaka Ohmori (Osaka Univ.)
pp. 47 - 51
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.