IEICE Technical Report

Print edition: ISSN 0913-5685

Volume 106, Number 550

Integrated Circuits and Devices

Workshop Date : 2007-03-07 / Issue Date : 2007-02-28

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Table of contents

ICD2006-197
Multi-Port Filters Using On-Chip Transmission Lines for Millimeter-Wave CMOS
Naoki Kobayashi, Minoru Fujishima (The Univ. Tokyo)
pp. 1 - 6

ICD2006-198
A Scalable Model of Shielded Capacitors using Mirror Image Effects
Koji Ishibashi, Minoru Fujishima (The Univ. Tokyo)
pp. 7 - 12

ICD2006-199
Partially-parallel decoder based on high-efficiency message-passing schedule for irregular LDPC code
Xing Li, Kazunori Shimizu, Takeshi Ikenaga, Satoshi Goto (Waseda Univ.)
pp. 13 - 18

ICD2006-200
Fast Motion Estimation Algorithm Employing Adaptively Assigned Stopping Condition
Nobuaki Kobayashi, Tadayoshi Enomoto (Chuo Univ.)
pp. 19 - 24

ICD2006-201
A 90-nm CMOS Motion Estimation Processor for MPEG4 implementing Dynamic Voltage and Frequency Scaling
Yuhgo Ishikawa, Tatsuya Kaneko, Takeshi Iwanari, Hiroaki Nakayama, Toshihiro Tsutusi, Yousuke Hagiwara, Nobuaki Kobayashi, Tadayoshi Enomoto (Chuo Univ.)
pp. 25 - 30

ICD2006-202
Hardware/Software Automatic Partitioning using Behavioral Synthesis
Daisuke Iwama, Naoto Miyamoto, Shigetoshi Sugawa, Tadahiro Ohmi (Tohoku Univ.)
pp. 31 - 36

ICD2006-203
Design Checker for System-Level Design using Extended System Dependence Graph
Daisuke Ando, Takeshi Matsumoto, Tasuku Nishihara, Masahiro Fujita (Univ. of Tokyo)
pp. 37 - 42

ICD2006-204
Specification description and verification methods for IPs of hardware design
Yuji Ishikawa (Univ. of Tokyo), SeongWoon Kang (Samsung), Yeonbok Lee (Univ. of Tokyo), GiLark Park (Samsung), Shota Watanabe, Kenshu Seto, Satoshi Komatsu (Univ. of Tokyo), Hirofumi Hamamura (Samsung), Masahiro Fujita (Univ. of Tokyo)
pp. 43 - 48

ICD2006-205
IP library retrieval system for design reuse
Yeonbok Lee (University of Tokyo), GiLark Park (SAMSUNG), Yuji Ishikawa (University of Tokyo), SeongWoon Kang (SAMSUNG), Shota Watanabe, Kenshu Seto, Satoshi Komatsu (University of Tokyo), Hirofumi Hamamura (SAMSUNG), Masahiro Fujita (University of Tokyo)
pp. 49 - 54

ICD2006-206
Equivalent Circuit Modeling of Guard Ring Structures for Evaluation of Substrate Crosstalk Isolation
Daisuke Kosaka, Makoto Nagata (Kobe Univ.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec)
pp. 55 - 60

ICD2006-207
On-chip monitoring for sub-100-nm digital signal integrity
Yoji Bando, Koichiro Noguchi, Makoto Nagata (Kobe Univ.)
pp. 61 - 66

ICD2006-208
A Gate Sizing Technique for Maximizing Timing Yield of CMOS Circuits
Ryota Sakamoto, Masanori Muroyama, Tohru Ishihara, Hiroto Yasuura (Kyushu Univ.)
pp. 67 - 72

ICD2006-209
A Study of Dependence on Gate Depth/Width for Analyzing Delay/Power Variations in 90nm CMOS Circuits
Masaki Yamaguchi (Kyushu Univ.), Yuan Yang (Xi’an Univ. of Technology), Ryota Sakamoto, Masanori Muroyama, Tohru Ishihara, Hiroto Yasuura (Kyushu Univ.)
pp. 73 - 78

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan